Polarization analysis of luminescence for the characterization of silicon wafer solar cells

Applied Physics Letters

Volumn 98, Issue 17, 2011, Pages

  Peloso, Matthew P ^a   Hoex, Bram ^a   Aberle, Armin G ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL PROPERTY; INTERNAL CHARGE; LUMINESCENCE IMAGING; LUMINESCENCE POLARIZATION; MATERIAL STRUCTURE; PARTIAL POLARIZATION; PHOTOVOLTAIC MATERIALS; POLARIZATION ANALYSIS; POLARIZED LUMINESCENCE;

CRYSTAL GROWTH; DEFECTS; ELECTRIC PROPERTIES; IMAGING TECHNIQUES; LUMINESCENCE; NANOSTRUCTURED MATERIALS; POLARIZATION; SILICON WAFERS; SOLAR CELLS;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 79955679712     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3584857     Document Type: Article

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