SCOPUS 정보 검색 플랫폼

Volumn 111, Issue 1, 2012, Pages

A comprehensive study on the leakage current mechanisms of Pt/SrTiO 3/Pt capacitor

(8) Mojarad, Shahin A a Kwa, Kelvin S K a Goss, Jonathan P a Zhou, Zhiyong a Ponon, Nikhil K a Appleby, Daniel J R a Al Hamadany, Raied A S a O'Neill, Anthony a

a NEWCASTLE UNIVERSITY (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED VOLTAGES; COMPREHENSIVE STUDIES; CROSSOVER POINTS; CURRENT CHARACTERISTIC; CURRENT MECHANISMS; DEVICE PARAMETERS; HIGH FIELD; HIGHLY SENSITIVE; MIM CAPACITORS; NEGATIVE VOLTAGE; POSITIVE CURRENT; SHARP INCREASE; SRTIO; THERMIONIC FIELD EMISSION; TUNNELING PHENOMENA;

ATOMIC LAYER DEPOSITION; BIAS VOLTAGE; CAPACITORS; LEAKAGE CURRENTS; MIM DEVICES; PLATINUM;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 84862923303 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3673574 Document Type: Article

Times cited : (52)

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