SCOPUS 정보 검색 플랫폼

Volumn 97, Issue 24, 2010, Pages

Space-charge-limited leakage current in high dielectric constant and ferroelectric thin films considering the field-dependent permittivity

(5) Sun, J a Zheng, X J a Yin, W a Tang, M H a Li, W a

a XIANGTAN UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL OBSERVATION; FERROELECTRIC PARAMETERS; FERROELECTRIC POLARIZATION; FIELD-DEPENDENT PERMITTIVITY; HIGH DIELECTRIC CONSTANTS; HIGH-FIELD; QUASI-OHMIC; SPACE-CHARGE-LIMITED;

CURRENT DENSITY; FERROELECTRIC FILMS; FERROELECTRIC THIN FILMS; FERROELECTRICITY; PERMITTIVITY; POLARIZATION;

LEAKAGE CURRENTS;

EID: 78650407608 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3525711 Document Type: Article

Times cited : (17)

References (21)

1
- 0032680399
- IBMJAE 0018-8646,. 10.1147/rd.433.0367
- D. E. Kotecki, J. D. Baniecki, H. Shen, R. B. Laibowitz, K. L. Saenger, J. J. Lian, T. M. Shaw, S. D. Athavale, C. Cabral, P. R. Duncombe, M. Gutsche, G. Kunkel, Y. -J. Park, Y. -Y. Wang, and R. Wise, IBM J. Res. Dev. IBMJAE 0018-8646 43, 367 (1999). 10.1147/rd.433.0367
- (1999) IBM J. Res. Dev. , vol.43 , pp. 367
- Kotecki, D.E.¹ Baniecki, J.D.² Shen, H.³ Laibowitz, R.B.⁴ Saenger, K.L.⁵ Lian, J.J.⁶ Shaw, T.M.⁷ Athavale, S.D.⁸ Cabral, C.⁹ Duncombe, P.R.¹⁰ Gutsche, M.¹¹ Kunkel, G.¹² Park, Y.-J.¹³ Wang, Y.-Y.¹⁴ Wise, R.¹⁵

2
- 0037065055
- 2 electrodes
- DOI 10.1063/1.1519359
- J. D. Baniecki, J. S. Cross, and M. Tsukada, Appl. Phys. Lett. APPLAB 0003-6951 81, 3837 (2002). 10.1063/1.1519359 (Pubitemid 35445527)
- (2002) Applied Physics Letters , vol.81 , Issue.20 , pp. 3837-3839
- Baniecki, J.D.¹ Cross, J.S.² Tsukada, M.³ Watanabe, J.⁴

3
- 0036328593
- FUSTA4 0016-2523.
- Y. Imanaka, T. Shioga, and J. D. Baniecki, Fujitsu Sci. Tech. J. FUSTA4 0016-2523 38, 22 (2002).
- (2002) Fujitsu Sci. Tech. J. , vol.38 , pp. 22
- Imanaka, Y.¹ Shioga, T.² Baniecki, J.D.³

4
- 0031161978
- IETMAB 0018-9480,. 10.1109/22.588610
- F. De Flaviis, N. G. Alexopoulos, and O. M. Stafsudd, IEEE Trans. Microwave Theory Tech. IETMAB 0018-9480 45, 963 (1997). 10.1109/22.588610
- (1997) IEEE Trans. Microwave Theory Tech. , vol.45 , pp. 963
- De Flaviis, F.¹ Alexopoulos, N.G.² Stafsudd, O.M.³

5
- 0028454861
- JMREEE 0884-2914,. 10.1557/JMR.1994.1484
- H. Hu and S. B. Krupanidhi, J. Mater. Res. JMREEE 0884-2914 9, 1484 (1994). 10.1557/JMR.1994.1484
- (1994) J. Mater. Res. , vol.9 , pp. 1484
- Hu, H.¹ Krupanidhi, S.B.²

6
- 0037449309
- APPLAB 0003-6951,. 10.1063/1.1529087
- H. Yang, K. Tao, B. Chen, X. Qiu, B. Xu, and B. Zhao, Appl. Phys. Lett. APPLAB 0003-6951 81, 4817 (2002). 10.1063/1.1529087
- (2002) Appl. Phys. Lett. , vol.81 , pp. 4817
- Yang, H.¹ Tao, K.² Chen, B.³ Qiu, X.⁴ Xu, B.⁵ Zhao, B.⁶

7
- 20844441756
- High-field conduction in barium titanate
- DOI 10.1063/1.1886899, 152903
- F. D. Morrison, P. Zubko, D. J. Jung, J. F. Scott, P. Baxter, M. M. Saad, R. M. Bowman, and J. M. Gregg, Appl. Phys. Lett. APPLAB 0003-6951 86, 152903 (2005). 10.1063/1.1886899 (Pubitemid 40861438)
- (2005) Applied Physics Letters , vol.86 , Issue.15 , pp. 1-3
- Morrison, F.D.¹ Zubko, P.² Jung, D.J.³ Scott, J.F.⁴ Baxter, P.⁵ Saad, M.M.⁶ Bowman, R.M.⁷ Gregg, J.M.⁸

8
- 0000182118
- Fatigue in sol-gel derived barium titanate films
- DOI 10.1063/1.369453, PII S002189799804523X
- H. B. Sharma, H. N. K. Sarma, and A. Mansingh, J. Appl. Phys. JAPIAU 0021-8979 85, 341 (1999). 10.1063/1.369453 (Pubitemid 129710136)
- (1999) Journal of Applied Physics , vol.85 , Issue.1 , pp. 341-346
- Sharma, H.B.¹ Sarma, H.N.K.² Mansingh, A.³

9
- 33744511722
- Space-charge-limited leakage current characteristics influenced by field-dependent permittivity in high dielectric constant and ferroelectric thin films
- DOI 10.1063/1.2203512
- J. Li, X. Dong, Y. Chen, and Y. Zhang, Appl. Phys. Lett. APPLAB 0003-6951 88, 212905 (2006). 10.1063/1.2203512 (Pubitemid 43814840)
- (2006) Applied Physics Letters , vol.88 , Issue.21 , pp. 212905
- Li, J.¹ Dong, X.² Chen, Y.³ Zhang, Y.⁴

10
- 29744464077
- Metal-ferroelectric-metal heterostructures with Schottky contacts. I. Influence of the ferroelectric properties
- DOI 10.1063/1.2148622, 124103
- L. Pintilie and M. Alexe, J. Appl. Phys. JAPIAU 0021-8979 98, 124103 (2005). 10.1063/1.2148622 (Pubitemid 43032126)
- (2005) Journal of Applied Physics , vol.98 , Issue.12 , pp. 1-8
- Pintilie, L.¹ Alexe, M.²

11
- 33845748695
- Space charge effects in ferroelectric thin films
- DOI 10.1063/1.2382459
- P. Zubko, D. J. Jung, and J. F. Scott, J. Appl. Phys. JAPIAU 0021-8979 100, 114112 (2006). 10.1063/1.2382459 (Pubitemid 46012220)
- (2006) Journal of Applied Physics , vol.100 , Issue.11 , pp. 114112
- Zubko, P.¹ Jung, D.J.² Scott, J.F.³

12
- 0019318351
- ELLEAK 0013-5194,. 10.1049/el:19800639
- Y. K. Sharma, Electron. Lett. ELLEAK 0013-5194 16, 896 (1980). 10.1049/el:19800639
- (1980) Electron. Lett. , vol.16 , pp. 896
- Sharma, Y.K.¹

13
- 0003636039
- PHRVAO 0031-899X,. 10.1103/PhysRev.90.753
- W. Shockley and R. C. Prim, Phys. Rev. PHRVAO 0031-899X 90, 753 (1953). 10.1103/PhysRev.90.753
- (1953) Phys. Rev. , vol.90 , pp. 753
- Shockley, W.¹ Prim, R.C.²

14
- 12044258321
- PRLTAO 0031-9007,. 10.1103/PhysRevLett.73.2107
- P. W. M. Blom, R. M. Wolf, J. F. M. Cillessen, and M. P. C. M. Krijn, Phys. Rev. Lett. PRLTAO 0031-9007 73, 2107 (1994). 10.1103/PhysRevLett.73.2107
- (1994) Phys. Rev. Lett. , vol.73 , pp. 2107
- Blom, P.W.M.¹ Wolf, R.M.² Cillessen, J.F.M.³ Krijn, M.P.C.M.⁴

15
- 0032606532
- JAPIAU 0021-8979,. 10.1063/1.370759
- J. C. Shin, J. Park, C. S. Hwang, and H. J. Kim, J. Appl. Phys. JAPIAU 0021-8979 86, 506 (1999). 10.1063/1.370759
- (1999) J. Appl. Phys. , vol.86 , pp. 506
- Shin, J.C.¹ Park, J.² Hwang, C.S.³ Kim, H.J.⁴

16
- 33746114495
- JAPIAU 0021-8979,. 10.1063/1.346845
- S. L. Miller, R. D. Nasby, J. R. Schwank, M. S. Rodger, and P. V. Dressendorfer, J. Appl. Phys. JAPIAU 0021-8979 68, 6463 (1990). 10.1063/1.346845
- (1990) J. Appl. Phys. , vol.68 , pp. 6463
- Miller, S.L.¹ Nasby, R.D.² Schwank, J.R.³ Rodger, M.S.⁴ Dressendorfer, P.V.⁵

17
- 33845799853
- 3 capacitors
- DOI 10.1063/1.2382479
- P. Zubko, D. J. Jung, and J. F. Scott, J. Appl. Phys. JAPIAU 0021-8979 100, 114113 (2006). 10.1063/1.2382479 (Pubitemid 46012221)
- (2006) Journal of Applied Physics , vol.100 , Issue.11 , pp. 114113
- Zubko, P.¹ Jung, D.J.² Scott, J.F.³

18
- 20844461113
- 3 thin films grown on MgO (001) single-crystal substrate
- DOI 10.1063/1.1938247, 212904
- D. Y. Wang, Y. Wang, X. Y. Zhou, H. L. W. Chan, and C. L. Choy, Appl. Phys. Lett. APPLAB 0003-6951 86, 212904 (2005). 10.1063/1.1938247 (Pubitemid 40861535)
- (2005) Applied Physics Letters , vol.86 , Issue.21 , pp. 1-3
- Wang, D.Y.¹ Wang, Y.² Zhou, X.Y.³ Chan, H.L.W.⁴ Choy, C.L.⁵

19
- 0004005306
- 2nd ed. (Wiley, New York).
- S. M. Sze, Physics of Semiconductor Devices, 2nd ed. (Wiley, New York, 1981).
- (1981) Physics of Semiconductor Devices
- Sze, S.M.¹

20
- 17444425671
- Dynamic leakage current compensation in ferroelectric thin-film capacitor structures
- DOI 10.1063/1.1897425, 142907
- R. Meyer, R. Waser, K. Prume, T. Schmitz, and S. Tiedke, Appl. Phys. Lett. APPLAB 0003-6951 86, 142907 (2005). 10.1063/1.1897425 (Pubitemid 40537408)
- (2005) Applied Physics Letters , vol.86 , Issue.14 , pp. 1-3
- Meyer, R.¹ Waser, R.² Prume, K.³ Schmitz, T.⁴ Tiedke, S.⁵

21
- 0000921522
- APPLAB 0003-6951,. 10.1063/1.126111
- C. Shin, C. S. Hwang, and H. J. Kim, Appl. Phys. Lett. APPLAB 0003-6951 76, 1609 (2000). 10.1063/1.126111
- (2000) Appl. Phys. Lett. , vol.76 , pp. 1609
- Shin, C.¹ Hwang, C.S.² Kim, H.J.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.