Effects of interface states on the transport properties of all-oxide La0.8Sr0.2CoO3SrTi0.99Nb 0.01O3p-n heterojunctions

Applied Physics Letters

Volumn 92, Issue 8, 2008, Pages

  Bruno, F Y ^a   Garcia Barriocanal, J ^a   Torija, M ^b   Rivera, A ^a   Sefrioui, Z ^a   Leighton, C ^b   Leon, C ^a   Santamaria, J ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

^b University of Minnesota   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CHARGE TRANSFER; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON TRANSPORT PROPERTIES; ELECTRON TUNNELING; EPITAXIAL GROWTH; RELAXATION PROCESSES;

CAPACITANCE RELAXATION; CAPACITANCE-VOLTAGE CHARACTERISTICS; INTERFACE STATES; TEMPERATURE RANGE;

LANTHANUM COMPOUNDS;

EID: 40049097686     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2887905     Document Type: Article

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