Thermally driven defect formation and blocking layers at metal-ZnO interfaces

Applied Physics Letters

Volumn 91, Issue 7, 2007, Pages

  Mosbacker, H L ^a,f   Zgrabik, C ^a   Hetzer, M J ^a   Swain, A ^b   Look, D C ^c,e   Cantwell, G ^d   Zhang, J ^d   Song, J J ^d,g   Brillson, L J ^a  

^a OHIO STATE UNIVERSITY   (United States)

^b Columbus School for Girls ^*

^c WRIGHT STATE UNIVERSITY   (United States)

^d ZN Technology   (United States)

^e AIR FORCE RESEARCH LABORATORY   (United States)

^f Ohio State University

^g UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; CURRENT VOLTAGE CHARACTERISTICS; OHMIC CONTACTS; POINT DEFECTS; THERMAL EFFECTS;

DEFECT EMISSIONS; OXIDE BLOCKING LAYERS; THERMODYNAMIC CONTROL;

INTERFACES (MATERIALS);

EID: 34548034713     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2772664     Document Type: Article

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