A comparative study on the electrical conduction mechanisms of (Ba 0.5Sr0.5)TiO3 thin films on Pt and IrO 2 electrodes

Journal of Applied Physics

Volumn 83, Issue 7, 1998, Pages 3703-3713

  Hwang, Cheol Seong ^a,b   Lee, Byoung Taek ^a   Kang, Chang Seok ^a   Kim, Jin Won ^a   Lee, Ki Hoon ^a   Cho, Hag Ju ^a   Horii, Hideki ^a   Kim, Wan Don ^a   Lee, Sang In ^a   Roh, Young Bum ^a   Lee, Moon Yong ^a  

^a SAMSUNG Electronics   (South Korea)

^b Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; CHEMICAL BONDS; ELECTRIC CONDUCTIVITY; ELECTRODES; ELECTRON ENERGY LEVELS; FABRICATION; LEAKAGE CURRENTS; OHMIC CONTACTS; OXIDES; PLATINUM; SPUTTER DEPOSITION;

ELECTRON TRAP; SCHOTTKY EMISSION BEHAVIOR;

THIN FILMS;

EID: 0032045710     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366595     Document Type: Review

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