The structural and electrical properties of thermally grown TiO2 thin films

Journal of Physics Condensed Matter

Volumn 18, Issue 2, 2006, Pages 645-657

  Chong, Lit Ho ^a   Mallik, Kanad ^a   De Groot, C H ^a   Kersting, Reinhard ^b  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

^b TASCON GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DEPOSITION; ELECTRIC CURRENTS; ELECTRIC PROPERTIES; ELECTRON BEAMS; EVAPORATION; FILM GROWTH; INTERFACES (MATERIALS); SECONDARY ION MASS SPECTROMETRY; THERMOOXIDATION; TITANIUM DIOXIDE;

CURRENT TRANSPORT; ELECTRON BEAM EVAPORATION; POOLE-FRENKEL (P-F) EMISSION; ROOM TEMPERATURE (RT);

THIN FILMS;

EID: 29144534577     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/18/2/020     Document Type: Article

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