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Volumn 159, Issue 6, 2012, Pages

Gadolinium -niobates and -tantalates: Amorphous high-k materials by aqueous CSD

Author keywords

[No Author keywords available]

Indexed keywords

AFM; CAPACITANCE VOLTAGE; CURRENT VOLTAGE; HIGH-K MATERIALS; K-VALUES; NIOBATES; ULTRA-THIN OXIDE FILMS; XRD;

EID: 84861360017     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/2.072206jes     Document Type: Article
Times cited : (5)

References (51)
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    • H. Wong and H. Iwai, Microelectron. Eng., 83, 1867 (2006). 10.1016/j.mee.2006.01.271
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    • 10.1016/j.jallcom.2005.10.061
    • M. Leskel, J. Alloy. Compd., 27 (2006). 10.1016/j.jallcom.2005.10.061
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    • Leskel, M.1
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    • The American Institute of Physics
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    • (1998)
    • Ahmed, K.1    Hauser, J.R.2
  • 43
    • 0037469679 scopus 로고    scopus 로고
    • 10.1016/S0920-5861(02)00353-X
    • M. Ziolek and I. Nowak, Catal. Today, 78, 543 (2003). 10.1016/S0920-5861(02)00353-X
    • (2003) Catal. Today , vol.78 , pp. 543
    • Ziolek, M.1    Nowak, I.2
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.