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Volumn , Issue , 2011, Pages 386-397

Accelerating microprocessor silicon validation by exposing ISA diversity

Author keywords

design debug; ISA diversity; microprocessor silicon validation

Indexed keywords

BUG DETECTION; BUG-FREE; DESIGN DEBUG; ISA DIVERSITY; ITS EFFICIENCIES; LIGHT WEIGHT; MICROPROCESSOR DESIGNS; POST-SILICON; POWERPC; RANDOM TESTS; SELF CHECKING; SILICON IMAGES; SIMULATION-BASED; TIME-TO-MARKET; VALIDATION PROCESS;

EID: 84858775392     PISSN: 10724451     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2155620.2155666     Document Type: Conference Paper
Times cited : (30)

References (35)
  • 14
    • 84858788603 scopus 로고    scopus 로고
    • presentation. Intel Corp.
    • N.Hakim. Introduction to Post-silicon Validation, presentation. Intel Corp. 2010, http://embedded.eecs.berkeley.edu/eecsx44/lectures//NagibHakim- PostSiValidation.pdf
    • (2010) Introduction to Post-silicon Validation
    • Hakim, N.1
  • 25
    • 70349732867 scopus 로고    scopus 로고
    • Post-silicon Bug Localization in Processors Using Instruction Footprint Recording and Analysis (IFRA)
    • S-B.Park, T.Hong and S.Mitra. Post-silicon Bug Localization in Processors Using Instruction Footprint Recording and Analysis (IFRA). In IEEE Transactions on Computer-Aided Design (TCAD), 28(10):1545-1558, 2009.
    • (2009) IEEE Transactions on Computer-Aided Design (TCAD) , vol.28 , Issue.10 , pp. 1545-1558
    • Park, S.-B.1    Hong, T.2    Mitra, S.3
  • 26
    • 34347392507 scopus 로고    scopus 로고
    • On the Cusp of a Validation Wall
    • P.Patra. On the Cusp of a Validation Wall. In IEEE Design & Test of Computers (D&T), 24(2):193-196, 2007.
    • (2007) IEEE Design & Test of Computers (D&T) , vol.24 , Issue.2 , pp. 193-196
    • Patra, P.1
  • 29
    • 0034292073 scopus 로고    scopus 로고
    • Postsilicon Validation Methodology for Microprocessors
    • H.Rotithor. Postsilicon Validation Methodology for Microprocessors. IEEE Design & Test of Computers (D&T), 17(4):77-88, 2000.
    • (2000) IEEE Design & Test of Computers (D&T) , vol.17 , Issue.4 , pp. 77-88
    • Rotithor, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.