The good, the bad, and the ugly of silicon debug

Proceedings - Design Automation Conference

Volumn , Issue , 2006, Pages 3-6

  Josephson, Doug ^a  

^a INTEL CORPORATION   (United States)

Author keywords

Characterization; Debug; Design for test and debug; Validation

Indexed keywords

AUTOMATION; PROGRAM DEBUGGING; SILICON; SOFTWARE PROTOTYPING;

DESIGN FOR TEST AND DEBUG; DESIGN PROTOTYPES; SILICON DEBUG;

INTEGRATED CIRCUIT LAYOUT;

EID: 34547172864     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1146909.1146915     Document Type: Conference Paper

References (13)

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