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Volumn , Issue , 2010, Pages 3-7

Post-silicon validation challenges: How EDA and academia can help

Author keywords

Design; Emulation; Test; Validation; Verification

Indexed keywords

CIRCUIT COMPLEXITY; CONTENT DEVELOPMENT; ELECTRONIC DESIGN AUTOMATION; EMULATION; HOLISTIC APPROACH; LAUNCH SCHEDULES; PERFORMANCE REQUIREMENTS; POST-SILICON; POST-SILICON DEBUG; PREDICTIVE TOOLS; STANDARD INTERFACE; TEST; VALIDATION; VALIDATION PROCESS;

EID: 77956193830     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1837274.1837278     Document Type: Conference Paper
Times cited : (60)

References (18)
  • 1
    • 77956210014 scopus 로고    scopus 로고
    • Intel Corp.
    • Intel Corp. 2003. Intel Platform and Component Validation, http://download.intel.com/design/chipsets/labtour/PVPT-WhitePaper.pdf
    • (2003) Intel Platform and Component Validation
  • 3
    • 27944465320 scopus 로고    scopus 로고
    • System-level validation of the intel® Pentium® M processor
    • May 2003URL:
    • Silas, I., Frumkin, I., Hazan, E., Mor, E., and Zobin, G., System-Level Validation of the Intel® Pentium® M Processor, Intel Technology Journal, Vol.7, Issue 2, May 2003URL:http://developer.intel.com/technology/itj/index.htm
    • Intel Technology Journal , vol.7 , Issue.2
    • Silas, I.1    Frumkin, I.2    Hazan, E.3    Mor, E.4    Zobin, G.5
  • 4
    • 77956213815 scopus 로고    scopus 로고
    • Post-silicon validation experience: History, trends, and challenges
    • Anaheim, June 9, 2008
    • Gray, R. 2008 Post-Silicon Validation Experience: History, Trends, and Challenges. GSRC Workshop on Post-Si Validation, Anaheim, June 9, 2008.
    • (2008) GSRC Workshop on Post-Si Validation
    • Gray, R.1
  • 5
    • 34347392507 scopus 로고    scopus 로고
    • On the cusp of a validation wall
    • Patra, P 2007. On the Cusp of a Validation Wall. Design & Test of Computers, IEEE, 24(2), 193-196.
    • (2007) Design & Test of Computers, IEEE , vol.24 , Issue.2 , pp. 193-196
    • Patra, P.1
  • 8
    • 77956218840 scopus 로고    scopus 로고
    • On the need for convergence between design validation and test
    • 2006
    • Yerramilli, S, 2006. On the Need for Convergence Between Design Validation and Test. In International Test Conference, 2006, ITC'06, 2006, p 14.
    • (2006) In International Test Conference 2006, ITC'06 , pp. 14
    • Yerramilli, S.1
  • 9
    • 0035392814 scopus 로고    scopus 로고
    • Coverage metrics for functional validation of hardware designs
    • Jul/Aug
    • S. Tasiran and K. Keutzer. Coverage metrics for functional validation of hardware designs. IEEE Design & Test of Computers, 18(7):36--45, Jul/Aug 2001.
    • (2001) IEEE Design & Test of Computers , vol.18 , Issue.7 , pp. 36-45
    • Tasiran, S.1    Keutzer, K.2
  • 11
    • 76549107770 scopus 로고    scopus 로고
    • Intelr® IBIST, the full vision realized
    • 1-6 Nov., doi: 10.1109/TEST.2009.5355667
    • Nejedlo, J.; Khanna, R.; "Intelr® IBIST, the full vision realized," Test Conference, 2009. ITC 2009. International, vol., no., pp.1-11, 1-6 Nov. 2009 doi: 10.1109/TEST.2009.5355667
    • (2009) Test Conference 2009 ITC 2009. International , pp. 1-11
    • Nejedlo, J.1    Khanna, R.2
  • 12
    • 51549119587 scopus 로고    scopus 로고
    • IFRA: Instruction footprint recording and analysis for post-silicon bug localization in processors
    • Anaheim, California: ACM, 2008
    • Park, S. and Mitra, S. 2008. IFRA: instruction footprint recording and analysis for post-silicon bug localization in processors," Proceedings of the 45th annual conference on Design automation, Anaheim, California: ACM, 2008, pp.373-378.
    • (2008) Proceedings of the 45th Annual Conference on Design Automation , pp. 373-378
    • Park, S.1    Mitra, S.2
  • 15
    • 70349732867 scopus 로고    scopus 로고
    • Post-silicon bug localization in processors using instruction footprint recording and analysis (IFRA)
    • Park, S. et al. 2009. Post-Silicon Bug Localization in Processors Using Instruction Footprint Recording and Analysis (IFRA). Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, 28(10), 1545-1558
    • (2009) Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on , vol.28 , Issue.10 , pp. 1545-1558
    • Park, S.1
  • 16
    • 77955216123 scopus 로고    scopus 로고
    • Algorithms for state restoration and trace signals selection for data acquisition in silicon debug
    • Feb
    • H. F. Ko and N. Nicolici, "Algorithms for State Restoration and Trace Signals Selection for Data Acquisition in Silicon Debug," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.28, no.2, pp. 285-297,Feb 2009.
    • (2009) IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems , vol.28 , Issue.2 , pp. 285-297
    • Ko, H.F.1    Nicolici, N.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.