Post-silicon validation opportunities, challenges and recent advances

Proceedings - Design Automation Conference

Volumn , Issue , 2010, Pages 12-17

  Mitra, Subhasish ^a   Seshia, Sanjit A ^b   Nicolici, Nicola ^c  

^a STANFORD UNIVERSITY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c MCMASTER UNIVERSITY   (Canada)

Author keywords

Post silicon validation

Indexed keywords

DESIGN COMPLEXITY; ELECTRONIC DESIGN AUTOMATION; MANUFACTURING TESTING; POST-SILICON; RESEARCH TOPICS; VALIDATION PROBLEM;

COMPUTER AIDED DESIGN;

AUTOMATION;

EID: 77956210287     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1837274.1837280     Document Type: Conference Paper

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