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Volumn , Issue , 2008, Pages 287-318

Defects and Interfacial Structure of a-plane GaN on r-plane Sapphire

Author keywords

a plane GaN; Defects; Epitaxy; Interfaces; Transmission electron microscopy

Indexed keywords


EID: 84856117438     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527623150.ch11     Document Type: Chapter
Times cited : (3)

References (63)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.