Chapter 5 Positron Annihilation Spectroscopy of Defects in Semiconductors

Semiconductors and Semimetals

Volumn 51, Issue PART A, 1998, Pages 209-285

  Saarinen, Kimmo ^a   Hautojärvi, Pekka ^a   Corbel, Catherine ^b  

^a AALTO UNIVERSITY   (Finland)

^b CEA SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS IN SEMICONDUCTORS;

POSITRON ANNIHILATION SPECTROSCOPY;

EID: 77956761126     PISSN: 00808784     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0080-8784(08)63057-4     Document Type: Article

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