![]() |
Volumn 74, Issue 9, 2002, Pages 1986-1992
|
Steady-state limiting currents at finite conical microelectrodes
|
Author keywords
[No Author keywords available]
|
Indexed keywords
HIGH-RESOLUTION ELECTROCHEMICAL IMAGING;
APPROXIMATION THEORY;
COMPUTER SIMULATION;
DIFFUSION;
FINITE ELEMENT METHOD;
IMAGING TECHNIQUES;
REACTION KINETICS;
MICROELECTRODES;
ANALYTIC METHOD;
ARTICLE;
CHEMICAL REACTION KINETICS;
DIFFUSION;
ELECTROCHEMICAL ANALYSIS;
FINITE ELEMENT ANALYSIS;
GEOMETRY;
IMAGING;
MEASUREMENT;
MICROELECTRODE;
MICROENVIRONMENT;
SIMULATION;
STEADY STATE;
THEORY;
THICKNESS;
|
EID: 0036571190
PISSN: 00032700
EISSN: None
Source Type: Journal
DOI: 10.1021/ac015669i Document Type: Article |
Times cited : (114)
|
References (53)
|