Alternating current (AC) impedance imaging with combined atomic force scanning electrochemical microscopy (AFM-SECM)

Electrochemistry Communications

Volumn 9, Issue 6, 2007, Pages 1311-1315

  Eckhard, K ^a   Shin, H ^b   Mizaikoff, B ^b   Schuhmann, W ^a   Kranz, C ^b  

^a RUHR UNIVERSITY BOCHUM   (Germany)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

AC SECM; AFM SECM; Integrated electrodes; Localized impedance

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; ELECTRIC IMPEDANCE; MICROELECTRODES; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTIES;

ALTERNATING CURRENT (AC) IMPEDANCE; INTEGRATED ELECTRODES; LOCALIZED IMPEDANCE; REDOX MEDIATOR;

IMAGING SYSTEMS;

EID: 34248669318     PISSN: 13882481     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elecom.2007.01.027     Document Type: Article

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