Developing an AFM-based SECM system; Instrumental setup, SECM simulation, characterization, and calibration

Journal of the Electrochemical Society

Volumn 155, Issue 8, 2008, Pages

  Davoodi, A ^a,b,d   Farzadi, A ^a   Pan, J ^a,d   Leygraf, C ^a,d   Zhu, Y ^c  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b HAKIM SABZEVARI UNIVERSITY   (Iran)

^c Slough Trading Estate   (United Kingdom)

^d ELECTROCHEMICAL SOCIETY

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALIBRATION; EQUATIONS OF STATE; GEOMETRY; GOLD; MICROELECTRODES; MOBILE TELECOMMUNICATION SYSTEMS; PLATINUM; SURFACE DEFECTS; THICKNESS MEASUREMENT;

ACTIVE SITES; AFM CANTILEVERS; ATOMIC FORCE (AF); CONCENTRATION PROFILES; CONVECTION DIFFUSION; CONVECTIVE TRANSPORT; DUAL MODES; ELECTROCHEMICAL MICROSCOPY; ELECTROCHEMICAL SOCIETY (ECS); GEOMETRICAL PARAMETERS; HIGH RESOLUTIONS; IN-SITU; LATERAL RESOLUTIONS; MICRO ELECTRODES; OPTIMIZED CONDITIONS; REDOX MEDIATORS; SCAN RATES; SCAN VELOCITY; SECM IMAGES; SPATIAL RESOLUTION (SR); THREE DIMENSIONS; TRANSIENT CONDITIONS; TWO TYPES;

ANALYTIC EQUIPMENT;

EID: 46649095279     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2943324     Document Type: Article

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