On mapping subangstrom electron clouds with force microscopy

Nano Letters

Volumn 11, Issue 11, 2011, Pages 5026-5033

  Wright, C Alan ^a   Solares, Santiago D ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM IMAGE; ATOMIC FORCE; ELECTRON CLOUDS; FEASIBILITY STUDIES; FORCE MICROSCOPY; GRAPHITE SURFACES; HIGHER HARMONICS; ORBITALS; SHORT-RANGE FORCES; SYMMETRY FEATURES; TIP APEX; TIP-SAMPLE INTERACTION; TUNGSTEN TIP;

CARRIER CONCENTRATION; DENSITY FUNCTIONAL THEORY; ELECTRON DENSITY MEASUREMENT; GRAPHITE; HARMONIC ANALYSIS; SCANNING TUNNELING MICROSCOPY; TUNGSTEN;

ELECTRONS;

GRAPHITE; NANOMATERIAL; TITANIUM; TITANIUM DIOXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; ELECTRON; MATERIALS TESTING; METHODOLOGY;

COMPUTER SIMULATION; ELECTRONS; GRAPHITE; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; MODELS, CHEMICAL; NANOSTRUCTURES; TITANIUM;

EID: 80755159091     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl2030773     Document Type: Article

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