Reversible short-range electrostatic imaging in frequency modulation atomic force microscopy on metallic surfaces

Nanotechnology

Volumn 15, Issue 2, 2004, Pages

  Dieška, Peter ^a   Štich, Ivan ^a   Pérez, Rubén ^b  

^a SLOVAK UNIVERSITY OF TECHNOLOGY   (Slovakia)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER INTERACTION; COVALENT BOND; FREQUENCY MODULATION ATOMIC FORCE MICROSCOPY; REVERSIBLE SHORT RANGE ELECTROSTATIC IMAGING;

ATOMS; CALCULATIONS; CHEMICAL BONDS; MOLECULAR DYNAMICS; SEMICONDUCTING SILICON; SURFACE STRUCTURE;

ATOMIC FORCE MICROSCOPY;

EID: 1442311756     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/15/2/012     Document Type: Article

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