Single-cantilever dual-frequency-modulation atomic force microscopy

Measurement Science and Technology

Volumn 20, Issue 1, 2009, Pages

  Chawla, Gaurav ^a   Solares, Santiago D ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Atomic force microscopy; FAM AFM; FM AFM; Force spectroscopy; Higher order eigenmodes; Multi frequency; Multimode; Nanomechanical characterization; Numerical simulation

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; MODULATION; NANOCANTILEVERS;

EIGEN MODES; FORCE SPECTROSCOPY; MULTI FREQUENCY; MULTIMODES; NANOMECHANICAL CHARACTERIZATION;

FREQUENCY MODULATION;

EID: 63749099315     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/20/1/015501     Document Type: Article

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