Theoretical simulation of noncontact AFM images of Si(111) √3×√3-Ag surface based on Fourier expansion method

Applied Surface Science

Volumn 157, Issue 4, 2000, Pages 367-372

  Sasaki, Naruo ^a   Aizawa, Hideaki ^a   Tsukada, Masaru ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; CRYSTAL ORIENTATION; SILICON; SILVER;

NONCONTACT ATOMIC FORCE MICROSCOPY (NC-AFM);

ATOMIC FORCE MICROSCOPY;

EID: 0033734206     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00552-8     Document Type: Article

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