Higher-harmonic atomic force microscopy

Surface and Interface Analysis

Volumn 38, Issue 12-13, 2006, Pages 1696-1701

  Giessibl, Franz J ^a,b  

^a UNIVERSITY OF AUGSBURG   (Germany)

^b UNIVERSITY OF REGENSBURG   (Germany)

Author keywords

Atomic force microscopy; Higher harmonics; qPlus sensor; Sub angstrom spatial resolution

Indexed keywords

CANTILEVER BEAMS; GRAPHITE; OPTICAL RESOLVING POWER; OSCILLATIONS; PIEZOELECTRICITY; QUARTZ; SENSORS;

DEFLECTION DETECTION; HIGHER HARMONICS; QPLUS SENSORS; SUB-ANGSTROM SPATIAL RESOLUTION;

ATOMIC FORCE MICROSCOPY;

EID: 33845942586     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2392     Document Type: Conference Paper

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