Numerical analysis of dynamic force spectroscopy using the torsional harmonic cantilever

Nanotechnology

Volumn 21, Issue 7, 2010, Pages

  Solares, Santiago D ^a   Hölscher, Hendrik ^b  

^a UNIVERSITY OF MARYLAND   (United States)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC FORCE SPECTROSCOPY; FLEXURAL-TORSIONAL; FORCE SPECTROSCOPY; FOURIER DATA; NUMERICAL SIMULATION; QUALITY FACTORS; SPECTRAL ANALYSIS METHOD; SPRING-MASS MODEL; SURFACE CONTOUR; TAPPING-MODE ATOMIC FORCE MICROSCOPY; TOPOGRAPHICAL IMAGES; UNIFORM FORCE; VACUUM ENVIRONMENT;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; COMPUTER SIMULATION; DATA PROCESSING; DYNAMIC ANALYSIS; NANOCANTILEVERS; NUMERICAL ANALYSIS; SPECTRUM ANALYZERS;

SPECTRUM ANALYSIS;

EID: 74949094519     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/7/075702     Document Type: Article

References (20)

1. Binnig G, Quate C F and Gerber C 1986 Atomic force microscope Phys. Rev. Lett. 56 930-3
2. Burnham N A and Colton R J 1989 Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope J. Vac. Sci. Technol. A 7 2906-13
3. Albrecht T R, Grütter P, Horne D and Rugar D 1991 Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity J. Appl. Phys. 69 668-73
4. Stark M, Stark R W, Heckl W M and Guckenberger R 2002 Inverting dynamic force microscopy: from signals to time-resolved interaction forces Proc. Natl Acad. Sci. USA 99 8473-8
5. Sahin O 2008 Accessing time-varying forces on the vibrating tip of the dynamic atomic force microscope to map material composition Isr. J. Chem. 48 55-63
6. Sahin O, Magonov S, Su C M, Quate C F and Solgaard O 2007 An atomic force microscope tip designed to measure time-varying nanomechanical forces Nat. Nanotechnol. 2 507-14
7. Solares S D and Hölscher H 2009 Numerical analysis of dynamic force spectroscopy using a dual-oscillator sensor J. Vac. Sci. Technol. B at press
8. Solares S D and Chawla G 2008 Dual frequency modulation with two cantilevers in series: a possible means to rapidly acquire tip-sample interaction force curves with dynamic AFM Meas. Sci. Technol. 19 055502
9. Hölscher H and Solares S D Provisional patent application: Cantilever with paddle for operation in dual-frequency mode, Forschungszentrum Karlsruhe invention disclosure # FZK-EM08044; University of Maryland College Park disclosure # PS-2008-095 Patent No. (15 September 2008)
10. Lin S M and Wang W R 2009 Frequency shifts and analysis of AFM accompanying with coupled flexural-torsional motions Int. J. Solids Struct. 46 4231-41
11. Garcia R and Perez R 2002 Dynamic atomic force microscopy methods Surf. Sci. Rep. 47 197-301
12. Israelachvilli J 1992 Intermolecular and Surface Forces (London: Academic) p450
13. Derjaguin B V, Muller V M and Toporov Y P 1975 Effect of contact deformations on adhesion of particles J. Colloid Interface Sci. 53 314-26
14. Gotsmann B, Seidel C, Anczykowski B and Fuchs H 1999 Conservative and dissipative tip-sample interaction forces probed with dynamic AFM Phys. Rev. B 60 11051-61
15. Rabe U, Janser K and Arnold W 1996 Vibrations of free and surface-coupled atomic force microscope cantilevers: theory and experiment Rev. Sci. Instrum. 67 3281-93
16. Vazquez R, Rubio-Sierra F J and Stark R W 2007 Multimodal analysis of force spectroscopy based on a transfer function study of microcantilevers Nanotechnology 18 185504
17. Rubio-Sierra F J, Vazquez R and Stark R W 2006 Transfer function analysis of the micro cantilever used in atomic force microscopy IEEE Trans. Nanotechnol. 5 692-700
18. Solares S D 2008 Characterization of deep nanoscale surface trenches with AFM using thin carbon nanotube probes in amplitude-modulation and frequency-force-modulation modes Meas. Sci. Technol. 19 015503
19. Jang J K, Schatz G C and Ratner M A 2004 Capillary force in atomic force microscopy J. Chem. Phys. 120 1157-60
20. Stifter M, Marti O and Bhushan B 2000 Theoretical investigation of the distance dependence of capillary and van der Waals forces in scanning force microscopy Phys. Rev. B 62 13667-73