First-principles study of the atomic-scale structure of clean silicon tips in dynamic force microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 74, Issue 16, 2006, Pages

  Caciuc, V ^a   Holscher H ^a   Blugel S ^b   Fuchs, H ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750088405     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.74.165318     Document Type: Article

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