Fine-grained power and body-bias control for near-threshold deep sub-micron CMOS circuits

IEEE Journal on Emerging and Selected Topics in Circuits and Systems

Volumn 1, Issue 2, 2011, Pages 131-140

  Kakoee, Mohammad Reza ^a   Benini, L ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

Forward body biasing (FBB); low power; multi Vdd; near threshold; post silicon tuning; power gating

Indexed keywords

FORWARD BODY BIASING; LOW POWER; MULTI-VDD; NEAR-THRESHOLD; POST-SILICON; POWER GATINGS;

BIAS VOLTAGE; CMOS INTEGRATED CIRCUITS; LEAKAGE CURRENTS; THRESHOLD VOLTAGE; TIMING CIRCUITS;

TUNING;

EID: 80052054946     PISSN: 21563357     EISSN: None     Source Type: Journal    
DOI: 10.1109/JETCAS.2011.2159285     Document Type: Article

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