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Volumn 109, Issue 5, 2011, Pages

Subband engineering for p-type silicon ultra-thin layers for increased carrier velocities: An atomistic analysis

Author keywords

[No Author keywords available]

Indexed keywords

ATOMISTIC ANALYSIS; BALLISTIC MODEL; CARRIER VELOCITY; CHANNEL MATERIALS; COMPREHENSIVE STUDIES; DEGREES OF FREEDOM; LAYER THICKNESS; LENGTH SCALE; MOBILITY MEASUREMENTS; ON-CURRENTS; OPTOELECTRONIC APPLICATIONS; P-TYPE; P-TYPE SILICON; SPIN ORBITS; SUB-BANDS; SURFACE CHANNEL; SURFACE ORIENTATION; TIGHT BINDING MODEL; TRANSPORT DIRECTION; ULTRA-THIN-BODY; ULTRATHIN LAYERS; VELOCITY ENHANCEMENT;

EID: 79953014492     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3556435     Document Type: Article
Times cited : (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.