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Ultra-narrow silicon nanowire gate-all-around CMOS devices: Impact of diameter, channel-orientation and low temperature on device performance
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Observation of single electron tunneling and ballistic transport in twin silicon nanowire MOSFETs (TSNWFETs) fabricated by topdown CMOS process
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International Electron Devices Meeting
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Experimental evidence of ballistic transport in cylindrical gateall-around twin silicon nanowire metal-oxide-semiconductor fieldeffect transistors
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Experimental study on quantum confinement effects in silicon nanowire metal-oxide-semiconductor field-effect transistors and single-electron transistors
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