메뉴 건너뛰기




Volumn 22, Issue 17, 2011, Pages

Fabrication and buckling dynamics of nanoneedle AFM probes

Author keywords

[No Author keywords available]

Indexed keywords

AFM PROBE; ATOMIC FORCE MICROSCOPES; BUCKLING DEFORMATION; ELECTRON BEAM-INDUCED DEPOSITION; HIGH ASPECT RATIO; NEEDLE LENGTH; PROBE TIPS; SCANNING ELECTRON MICROSCOPES; TIP-SAMPLE FORCES; VERTICAL DEFORMATION;

EID: 79952959067     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/17/175303     Document Type: Article
Times cited : (30)

References (48)
  • 33


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.