Transmission electron microscopy characterization and sculpting of sub-1 nm Si-O-C freestanding nanowires grown by electron beam induced deposition

Applied Physics Letters

Volumn 89, Issue 11, 2006, Pages

  Frabboni, S ^a,b   Gazzadi, G C ^a,b   Spessot, A ^a,b  

^a CNR Consiglio Nazionale delle Ricerche   (Italy)

^b UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CHARACTERIZATION; CONCENTRATION (PROCESS); DEPOSITION; ELECTRON BEAMS; ELECTRON ENERGY LOSS SPECTROSCOPY; SILICA; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON BEAM SCULPTING; NANOWIRES; NEAR EDGE STRUCTURE ANALYSES; OXIDATION STATE;

NANOSTRUCTURED MATERIALS;

EID: 33748710453     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2352723     Document Type: Article

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