Large flexibility of high aspect ratio carbon nanostructures fabricated by electron-beam-induced deposition

Nanotechnology

Volumn 21, Issue 47, 2010, Pages

  Beard, J D ^a   Gordeev, S N ^a  

^a University of Bath   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS CARBON STRUCTURES; CARBON NANOSTRUCTURES; ELASTIC BENDING; ELECTRON BEAM-INDUCED DEPOSITION; HIGH ASPECT RATIO; INELASTIC DEFORMATION; TOTAL LENGTH; VERTICAL DEFLECTIONS;

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; ELECTRON BEAMS; MECHANICAL PROPERTIES;

AMORPHOUS CARBON;

EID: 78650098707     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/47/475702     Document Type: Article

References (27)

1. Randolph S J, Fowlkes J D and Rack P D 2006 CRC Crit. Rev. Solid State Mater. Sci. 31 55
2. Gazzadi G C, Frabboni S and Menozzi C 2007 Nanotechnology 18 445709
3. Botman A, Mulders J J L, Weemaes R and Mentink S 2006 Nanotechnology 17 3779
4. Cho C C and Bernasek S L 1989 J. Appl. Phys. 65 3035
5. Cicoira F, Leifer K, Hoffmann P, Utke I, Dwir B, Laub D, Buffat P A, Kapon E and Doppelt P 2004 J. Cryst. Growth 265 619
6. van Dorp W F, van Someren B, Hagen C W and Kruit P 2005 Nano Lett. 5 1303
7. Hagen C Q, Silvis-Cividjian N and Kruit P 2006 Scanning 28 204
8. Ennos E A 1953 Br. J. Appl. Phys. 4 101
9. Burbridge D J, Crampin S, Viau G and Gordeev S N 2008 Nanotechnology 19 445302
10. Schiffmann K I 1993 Nanotechnology 4 163
11. Chen I-C, Chen L-H, Orme C, Quist A, Lal R and Jin S 2006 Nanotechnology 17 4322
12. Wendel M, Lorenz H and Kotthaus J P 1995 Appl. Phys. Lett. 67 3732
13. Beard J D, Burbridge D J, Moskalenko A V, Dudko O, Yarova P L, Smirnov S V and Gordeev S N 2009 Nanotechnology 20 445302
14. Ding W, Dikin D A, Chen X, Piner R D, Ruoff R S, Zussmann E, Wang X and Li X 2005 J. Appl. Phys. 98 014905
15. Kreuzer P 1998 Optik 78 158
16. Möllenstedt G 1988 Optik 78 132
17. Kislov N A, Khodos I I, Ivanov E D and Barthel J 1996 Scanning 18 114
18. Sader J E, Chon J W M and Mulvaney P 1999 Rev. Sci. Instrum. 70 3867
19. Gere J M and Timoshenko S P 1999 Mechanics of Materials 4th edn (Cheltenham: Stanley Thornes)
20. Sarid D 1991 Scanning Force Microscopy with Applications to Electric Magnetic and Atomic Forces (New York: Oxford University Press)
21. Bisshopp K E and Drucker D C 1945 Q. Appl. Math. 3 272
22. Belendez T, Neipp C and Belendez A 2002 Eur. J. Phys. 23 371
23. Ding W, Guo Z and Ruoff R S 2007 J. Appl. Phys. 101 034316
24. Marques F C, Lacerda R G, Champi A, Stolojan V, Cox D C and Silva S R P 2003 Appl. Phys. Lett. 83 3099
25. Lavrik N V, Sepaniak M J and Datskos P G 2004 Rev. Sci. Instrum. 75 2229
26. Lavrik N V and Datskos P G 2003 Appl. Phys. Lett. 82 2697
27. Lui Z Q, Mitsuishi K and Furuya K 2005 Appl. Phys. A 80 1437