Contribution to the contamination problem in transmission electron microscopy

Ultramicroscopy

Volumn 3, Issue C, 1978, Pages 169-174

  Reimer, L ^a   Wachter M ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPES, ELECTRON;

ELECTRON MICROSCOPY; METHODOLOGY;

HEAT; METHANOL; MICROSCOPY, ELECTRON; SPECIMEN HANDLING;

EID: 0018238605     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(78)80023-0     Document Type: Article

References (15)