Local surface potential of π-conjugated nanostructures by Kelvin Probe Force microscopy: Effect of the sampling depth

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Volumn 7, Issue 5, 2011, Pages 634-639

  Liscio, Andrea ^a   Palermo, Vincenzo ^a   Fenwick, Oliver ^b   Braun, Slawomir ^c   Müllen, Klaus ^d   Fahlman, Mats ^c   Cacialli, Franco ^b   Samorì, Paolo ^e  

^a Instituto per la Sintesi Organica e la Fotoreattivitá Consiglio   (Italy)

^b UNIVERSITY COLLEGE LONDON   (United Kingdom)

^c LINKÖPING UNIVERSITY   (Sweden)

^d MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

^e UNIVERSITÉ LOUIS PASTEUR   (France)

Author keywords

charge injection; conjugated nanostructures; interfaces; Kelvin Probe Force Microscopy; organic electronics; surface potential

Indexed keywords

3D MODELS; CONJUGATED NANOSTRUCTURES; ELECTRICAL PROPERTY; INTERFACES; INTERFACIAL PROPERTY; KELVIN PROBE FORCE MICROSCOPY; NANO SCALE; NANOSCALE ARCHITECTURES; NANOSTRUCTURED FILMS; ORGANIC ELECTRONICS; PERYLENES; POLY-3-HEXYLTHIOPHENE; QUANTITATIVE DETERMINATIONS; SEMICONDUCTING SYSTEMS; SOLAR-CELL APPLICATIONS; SURFACE SENSITIVITY; SURFACE TECHNIQUES; SURFACES AND INTERFACES; VERTICAL STRUCTURES;

ELECTRIC PROPERTIES; ELECTRONIC PROPERTIES; FIELD EFFECT TRANSISTORS; NANOSTRUCTURED MATERIALS; PROBES; SEMICONDUCTING FILMS; SURFACE POTENTIAL; SURFACE PROPERTIES; THREE DIMENSIONAL;

NANOSTRUCTURES;

DRUG DERIVATIVE; IMIDE; MACROGOL DERIVATIVE; NANOMATERIAL; PERYLENE; PERYLENE BISIMIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; METHODOLOGY; NANOTECHNOLOGY; SURFACE PROPERTY; ULTRASTRUCTURE;

IMIDES; MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES; NANOTECHNOLOGY; PERYLENE; POLYETHYLENE GLYCOLS; SURFACE PROPERTIES;

EID: 79952204411     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.201001770     Document Type: Article

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