Observation of stretched single DNA molecules by Kelvin probe force microscopy

Applied Surface Science

Volumn 210, Issue 1-2 SPEC., 2003, Pages 73-78

  Kwak, K J ^a   Yoda, S ^a   Fujihira, M ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Atomic force microscopy; Kelvin probe force microscopy; Molecular combing; Stretched DNA

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; CHEMICAL MODIFICATION; CHEMISORPTION; DNA; MOLECULES; SILANES; SILICON WAFERS; SOLUTIONS; SUBSTRATES;

MOLECULAR COMBING;

SURFACE PROPERTIES;

EID: 0037474572     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)01482-4     Document Type: Conference Paper

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