Kelvin probe and ultraviolet photoemission measurements of indium tin oxide work function: a comparison

Synthetic Metals

Volumn 111, Issue , 2000, Pages 311-314

  Kim, J S ^a   Lagel B ^b   Moons, E ^a   Johansson, N ^c   Baikie, I D ^b   Salaneck, W R ^c   Friend, R H ^a   Cacialli, F ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b ROBERT GORDON UNIVERSITY   (United Kingdom)

^c LINKÖPING UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODES; GOLD; IRRADIATION; OXYGEN; PHOTOELECTRON SPECTROSCOPY; PHOTONS; PLASMAS; SURFACE TREATMENT; THIN FILMS;

CONTACT POTENTIAL DIFFERENCE; GOLD REFERENCE ELECTRODE; INDIUM TIN OXIDE WORK FUNCTION; KELVIN PROBE; ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY;

INDIUM COMPOUNDS;

EID: 0039382261     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(99)00354-9     Document Type: Article

References (12)

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