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int = 0.0967), 272 parameters, R1 = 0.0540 (for reflections with I > 2σ(I)), wR2 = 0.1258 (for all reflections). All diffraction measurements were made on a Bruker SMART CCD diffractometer with graphite monochromated MoKα radiation. Data were collected at 153(2) K and the structure solved by direct methods using SHELXTL. All non-hydrogen atoms were refined anisotropically. Hydrogen atoms were included in idealized positions and not refined. Intensities were corrected for absorption. CCDC-247498 contains the supplementary crystallographic data for this paper. These data can be obtained free of charge via www.ccdc.cam.ac.uk/ conts/retrieving.html (or from the Cambridge Crystallographic Data Centre, 12 Union Road, Cambridge CB21EZ, UK; fax: (+44)1223-336-033; or deposit@ccdc.cam.ac.uk).
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note
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See Supporting Information which includes: Experimental details, TGA plots, thin film XRD data, SEM, and AFM micrographs, redox properties of PDI derivatives, and details of device fabrication/measurement.
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