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Volumn 93, Issue 7, 2003, Pages 4017-4022

Investigation of bottom-contact organic field effect transistors by two-dimensional device modeling

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; COMPUTER SIMULATION; HOLE MOBILITY; PERMITTIVITY; POISSON EQUATION; SCHOTTKY BARRIER DIODES; SILICON;

EID: 0037391004     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1558998     Document Type: Article
Times cited : (81)

References (14)
  • 10
    • 0003470014 scopus 로고    scopus 로고
    • edited by H. Ehrenreich and F. Spaepen (Academic, New York)
    • I. H. Campbell and D. L. Smith, in Solid State Physics, edited by H. Ehrenreich and F. Spaepen (Academic, New York, 2001).
    • (2001) Solid State Physics
    • Campbell, I.H.1    Smith, D.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.