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Volumn 93, Issue 7, 2003, Pages 4017-4022
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Investigation of bottom-contact organic field effect transistors by two-dimensional device modeling
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE CARRIERS;
COMPUTER SIMULATION;
HOLE MOBILITY;
PERMITTIVITY;
POISSON EQUATION;
SCHOTTKY BARRIER DIODES;
SILICON;
GATE INSULATORS;
FIELD EFFECT TRANSISTORS;
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EID: 0037391004
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1558998 Document Type: Article |
Times cited : (81)
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References (14)
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