Friction and wear on the atomic scale

Nanotribology and Nanomechanics (Second Edition): An Introduction

Volumn , Issue , 2008, Pages 557-605

  Gnecco, Enrico ^a   Bennewitz, Roland ^b   Pfeiffer, Oliver ^a   Socoliuc, Anisoara ^a   Meyer, Ernst ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

^b MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79751490465     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-3-540-77608-6_11     Document Type: Chapter

References (110)

1. C.M. Mate, G.M. McClelland, R. Erlandsson, S. Chiang: Atomic-scale friction of a tungsten tip on a graphite surface, Phys. Rev. Lett. 59, 1942-1945 (1987).
2. G. Binnig, C.F. Quate, Ch. Gerber: Atomic force microscope, Phys. Rev. Lett. 56, 930-933 (1986).
3. O. Marti, J. Colchero, J. Mlynek: Combined scanning force and friction microscopy of mica, Nanotechnology 1, 141-144 (1990).
4. G. Meyer, N. Amer: Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope, Appl. Phys. Lett. 57, 2089-2091 (1990).
5. G. Neubauer, S.R. Cohen, G.M. McClelland, D.E. Horn, C.M. Mate: Force microscopy with a bidirectional capacitance sensor, Rev. Sci. Instrum. 61, 2296-2308 (1990).
6. G.M. McClelland, J. N. Glosli: Friction at the atomic scale. In: NATO ASI Series E, Vol. 220, ed. by L. Singer, H.M. Pollock (Kluwer, Dordrecht 1992) pp. 405-425.
7. R. Linnemann, T. Gotszalk, I.W. Rangelow, P. Dumania, E. Oesterschulze: Atomic force microscopy and lateral force microscopy using piezoresistive cantilevers, J. Vacuum Sci. Technol. B 14, 856-860 (1996).
8. M. Nonnenmacher, J. Greschner, O. Wolter, R. Kassing: Scanning force microscopy with micromachined silicon sensors, J. Vacuum Sci. Technol. B 9, 1358-1362 (1991).
9. R. Lüthi: Untersuchungen zur Nanotribologie und zur Auflösungsgrenze im Ultrahochvakuum mittels Rasterkraftmikroskopie. Ph.D. Thesis (Univ. of Basel, Basel 1996).
10. J. Cleveland, S. Manne, D. Bocek, P.K. Hansma: A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy, Rev. Sci. Instrum. 64, 403-405 (1993).
11. J.L. Hutter, J. Bechhoefer: Calibration of atomic-force microscope tips, Rev. Sci. Instrum. 64, 1868-1873 (1993).
12. H. J. Butt, M. Jaschke: Calculation of thermal noise in atomic-force microscopy, Nanotechnology 6, 1-7 (1995).
13. J.M. Neumeister, W.A. Ducker: Lateral, normal, and longitudinal spring constants of atomic-force microscopy cantilevers, Rev. Sci. Instrum. 65, 2527-2531 (1994).
14. D.F. Ogletree, R.W. Carpick, M. Salmeron: Calibration of frictional forces in atomic force microscopy, Rev. Sci. Instrum. 67, 3298-3306 (1996).
15. E. Gnecco: AFM study of friction phenomena on the nanometer scale. Ph.D. Thesis (Univ. of Genova, Genova 2001).
16. U. D. Schwarz, P. Köster, R. Wiesendanger: Quantitative analysis of lateral force microscopy experiments, Rev. Sci. Instrum. 67, 2560-2567 (1996).
17. E. Meyer, R. Lüthi, L. Howald, M. Bammerlin, M. Guggisberg, H.-J. Güntherodt: Sitespecific friction force spectroscopy, J. Vacuum Sci. Technol. B 14, 1285-1288 (1996).
18. S.S. Sheiko, M. Möller, E.M.C.M. Reuvekamp, H.W. Zandberger: Calibration and evaluation of scanning-force microscopy probes, Phys. Rev. B 48, 5675 (1993).
19. F. Atamny, A. Baiker: Direct imaging of the tip shape by AFM, Surf. Sci. 323, L314 (1995).
20. J. S. Villarrubia: Algorithms for scanned probe microscope image simulation, surface reconstruction, and tip estimation, J. Res. Natl. Inst. Stand. Technol. 102, 425-454 (1997).
21. L. Howald, E. Meyer, R. Lüthi, H. Haefke, R. Overney, H. Rudin, H.-J. Güntherodt: Multifunctional probe microscope for facile operation in ultrahigh vacuum, Appl. Phys. Lett. 63, 117-119 (1993).
22. Q. Dai, R. Vollmer, R.W. Carpick, D.F. Ogletree, M. Salmeron: A variable temperature ultrahigh vacuum atomic force microscope, Rev. Sci. Instrum. 66, 5266-5271 (1995).
23. G.A. Tomlinson: A molecular theory of friction, Philos. Mag. Ser. 7, 905 (1929).
24. T. Gyalog, M. Bammerlin, R. Lüthi, E. Meyer, H. Thomas: Mechanism of atomic friction, Europhys. Lett. 31, 269-274 (1995).
25. T. Gyalog, H. Thomas: Friction between atomically flat surfaces, Europhys. Lett. 37, 195-200 (1997).
26. M. Weiss, F. J. Elmer: Dry friction in the Frenkel-Kontorova-Tomlinson model: Static properties, Phys. Rev. B 53, 7539-7549 (1996).
27. J.B. Pethica: Comment on "Interatomic forces in scanning tunneling microscopy: Giant corrugations of the graphite surface", Phys. Rev. Lett. 57, 3235 (1986).
28. E. Meyer, R.M. Overney, K. Dransfeld, T. Gyalog: Nanoscience, Friction and Rheology on the Nanometer Scale (World Scientific, Singapore 1998).
29. A. Socoliuc, R. Bennewitz, E. Gnecco, E. Meyer: Transition from stick-slip to continuous sliding in atomic friction: Entering a new regime of ultralow friction, Phys. Rev. Lett. 92, 134301 (2004).
30. L. Howald, R. Lüthi, E. Meyer, H.-J. Güntherodt: Atomic-force microscopy on the Si(111)7×7 surface, Phys. Rev. B 51, 5484-5487 (1995).
31. R. Bennewitz, T. Gyalog, M. Guggisberg, M. Bammerlin, E. Meyer, H.-J. Güntherodt: Atomic-scale stick-slip processes on Cu(111), Phys. Rev. B 60, R11301-R11304 (1999).
32. R. Lüthi, E. Meyer, M. Bammerlin, L. Howald, H. Haefke, T. Lehmann, C. Loppacher, H.-J. Güntherodt, T. Gyalog, H. Thomas: Friction on the atomic scale: An ultrahigh vacuum atomic force microscopy study on ionic crystals, J. Vacuum Sci. Technol. B 14, 1280-1284 (1996).
33. G. J. Germann, S.R. Cohen, G. Neubauer, G.M. McClelland, H. Seki: Atomic-scale friction of a diamond tip on diamond (100) and (111) surfaces, J. Appl. Phys. 73, 163-167 (1993).
34. R. J.A. van den Oetelaar, C.F. J. Flipse: Atomic-scale friction on diamond(111) studied by ultrahigh vacuum atomic force microscopy, Surf. Sci. 384, L828-L835 (1997).
35. R. Bennewitz, E. Gnecco, T. Gyalog, E. Meyer: Atomic friction studies on well-defined surfaces, Tribol. Lett. 10, 51-56 (2001).
36. S. Fujisawa, E. Kishi, Y. Sugawara, S. Morita: Atomic-scale friction observed with a two-dimensional frictional-force microscope, Phys. Rev. B 51, 7849-7857 (1995).
37. N. Sasaki, M. Kobayashi, M. Tsukada: Atomic-scale friction image of graphite in atomic-force microscopy, Phys. Rev. B 54, 2138-2149 (1996).
38. H. Kawakatsu, T. Saito: Scanning force microscopy with two optical levers for detection of deformations of the cantilever, J. Vacuum Sci. Technol. B 14, 872-876 (1996).
39. M. Hirano, K. Shinjo, R. Kaneko, Y. Murata: Anisotropy of frictional forces in muscovite mica, Phys. Rev. Lett. 67, 2642-2645 (1991).
40. M. Hirano, K. Shinjo, R. Kaneko, Y. Murata: Observation of superlubricity by scanning tunneling microscopy, Phys. Rev. Lett. 78, 1448-1451 (1997).
41. M. Liley, D. Gourdon, D. Stamou, U. Meseth, T.M. Fischer, C. Lautz, H. Stahlberg, H. Vogel, N.A. Burnham, C. Duschl: Friction anisotropy and asymmetry of a compliant monolayer induced by a small molecular tilt, Science 280, 273-275 (1998).
42. R. Lüthi, E. Meyer, H. Haefke, L. Howald, W. Gutmannsbauer, H.-J. Güntherodt: Sledtype motion on the nanometer scale: Determination of dissipation and cohesive energies of C60, Science 266, 1979-1981 (1994).
43. M.R. Falvo, J. Steele, R.M. Taylor, R. Superfine: Evidence of commensurate contact and rolling motion: AFM manipulation studies of carbon nanotubes on HOPG, Tribol. Lett. 9, 73-76 (2000).
44. R.M. Overney, H. Takano, M. Fujihira, W. Paulus, H. Ringsdorf: Anisotropy in friction and molecular stick-slip motion, Phys. Rev. Lett. 72, 3546-3549 (1994).
45. H. Takano, M. Fujihira: Study of molecular scale friction on stearic acid crystals by friction force microscopy, J. Vacuum Sci. Technol. B 14, 1272-1275 (1996).
46. M. Dienwiebel, G. Verhoeven, N. Pradeep, J. Frenken, J. Heimberg, H. Zandbergen: Superlubricity of graphite, Phys. Rev. Lett. 92, 126101 (2004).
47. 3 structures by atomic force microscopy, Science 272, 1158-1161 (1996).
48. E. Gnecco, R. Bennewitz, T. Gyalog, Ch. Loppacher, M. Bammerlin, E. Meyer, H.-J. Güntherodt: Velocity dependence of atomic friction, Phys. Rev. Lett. 84, 1172-1175 (2000).
49. D. Gourdon, N.A. Burnham, A. Kulik, E. Dupas, F. Oulevey, G. Gremaud, D. Stamou, M. Liley, Z. Dienes, H. Vogel, C. Duschl: The dependence of friction anisotropies on the molecular organization of LB films as observed by AFM, Tribol. Lett. 3, 317-324 (1997).
50. Y. Sang, M. Dubé, M. Grant: Thermal effects on atomic friction, Phys. Rev. Lett. 87, 174301 (2001).
51. E. Riedo, E. Gnecco, R. Bennewitz, E. Meyer, H. Brune: Interaction potential and hopping dynamics governing sliding friction, Phys. Rev. Lett. 91, 084502 (2003).
52. P. Reimann, M. Evstigneev: Nonmonotonic velocity dependence of atomic friction, Phys. Rev. Lett. 93, 230802 (2004).
53. C. Fusco, A. Fasolino: Velocity dependence of atomic-scale friction: A comparative study of the one-And two-dimensional Tomlinson model, Phys. Rev. B 71, 45413 (2005).
54. O. Zwörner, H. Hölscher, U.D. Schwarz, R. Wiesendanger: The velocity dependence of frictional forces in point-contact friction, Appl. Phys. A 66, 263-267 (1998).
55. T. Bouhacina, J.P. Aimé, S. Gauthier, D. Michel, V. Heroguez: Tribological behavior of a polymer grafted on silanized silica probed with a nanotip, Phys. Rev. B 56, 7694-7703 (1997).
56. H. J. Eyring: The activated complex in chemical reactions, J. Chem. Phys. 3, 107 (1937).
57. J.N. Glosli, G.M. McClelland: Molecular dynamics study of sliding friction of ordered organic monolayers, Phys. Rev. Lett. 70, 1960-1963 (1993).
58. O. Pfeiffer, R. Bennewitz, A. Baratoff, E.Meyer, P.Grütter: Lateral-force measurements in dynamic force microscopy, Phys. Rev. B 65, 161403 (2002).
59. E. Riedo, F. Lévy, H. Brune: Kinetics of capillary condensation in nanoscopic sliding friction, Phys. Rev. Lett. 88, 185505 (2002).
60. M. He, A.S. Blum, G. Overney, R.M. Overney: Effect of interfacial liquid structuring on the coherence length in nanolubrucation, Phys. Rev. Lett. 88, 154302 (2002).
61. F.P. Bowden, F.P. Tabor: The Friction and Lubrication of Solids (Oxford Univ. Press, Oxford 1950).
62. L.D. Landau, E.M. Lifshitz: Introduction to Theoretical Physics (Nauka, Moscow 1998) Vol. 7.
63. J. A. Greenwood, J. B.P. Williamson: Contact of nominally flat surfaces, Proc. R. Soc. Lond. A 295, 300 (1966).
64. B. N. J. Persson: Elastoplastic contact between randomly rough surfaces, Phys. Rev. Lett. 87, 116101 (2001).
65. U. D. Schwarz, O. Zwörner, P. Köster, R. Wiesendanger: Quantitative analysis of the frictional properties of solid materials at low loads, Phys. Rev. B 56, 6987-6996 (1997).
66. K.L. Johnson, K. Kendall, A.D. Roberts: Surface energy and contact of elastic solids, Proc. R. Soc. Lond. A 324, 301 (1971).
67. B.V. Derjaguin, V.M. Muller, Y.P. Toporov: Effect of contact deformations on adhesion of PARTicles, J. Colloid Interf. Sci. 53, 314-326 (1975).
68. D. Tabor: Surface forces and surface interactions, J. Colloid Interf. Sci. 58, 2-13 (1977).
69. D. Maugis: Adhesion of spheres: The JKR-DMT transition using a Dugdale model, J. Colloid Interf. Sci. 150, 243-269 (1992).
70. R.W. Carpick, N. Agraït, D.F. Ogletree, M. Salmeron: Measurement of interfacial shear (friction) with an ultrahigh vacuum atomic force microscope, J. Vacuum Sci. Technol. B 14, 1289-1295 (1996).
71. C. Polaczyk, T. Schneider, J. Schöfer, E. Santner: Microtribological behavior of Au(001) studied by AFM/FFM, Surf. Sci. 402, 454-458 (1998).
72. R.W. Carpick, D.F. Ogletree, M. Salmeron: Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopy, Appl. Phys. Lett. 70, 1548-1550 (1997).
73. J. N. Israelachvili, D. Tabor: Measurement of Van Der Waals dispersion forces in range 1.5 to 130 nm, Proc. R. Soc. Lond. A 331, 19 (1972).
74. S.P. Jarvis, A. Oral, T.P. Weihs, J.B. Pethica: A novel force microscope and pointcontact probe, Rev. Sci. Instrum. 64, 3515-3520 (1993).
75. 2, Phys. Rev. B 55, 10776-10785 (1997).
76. K.L. Johnson: Contact Mechanics (Cambridge Univ. Press, Cambridge 1985).
77. M. Enachescu, R. J.A. van den Oetelaar, R.W. Carpick, D.F. Ogletree, C.F. J. Flipse, M. Salmeron: Atomic force microscopy study of an ideally hard contact: The diamond(111)/tungsten carbide interface, Phys. Rev. Lett. 81, 1877-1880 (1998).
78. M. Enachescu, R. J.A. van den Oetelaar, R.W. Carpick, D.F. Ogletree, C.F. J. Flipse, M. Salmeron: Observation of proportionality between friction and contact area at the nanometer scale, Tribol. Lett. 7, 73-78 (1999).
79. E. Gnecco, R. Bennewitz, E. Meyer: Abrasive wear on the atomic scale, Phys. Rev. Lett. 88, 215501 (2002).
80. S. Kopta, M. Salmeron: The atomic scale origin of wear on mica and its contribution to friction, J. Chem. Phys. 113, 8249-8252 (2000).
81. H. Tang, C. Joachim, J. Devillers: Interpretation of AFM images-The graphite surface with a diamond tip, Surf. Sci. 291, 439-450 (1993).
82. U. Landman, W.D. Luedtke, E.M. Ringer: Atomistic mechanisms of adhesive contact formation and interfacial processes, Wear 153, 3-30 (1992).
83. A. I. Livshits, A.L. Shluger: Self-lubrication in scanning force microscope image formation on ionic surfaces, Phys. Rev. B 56, 12482-12489 (1997).
84. H. Tang, X. Bouju, C. Joachim, C. Girard, J. Devillers: Theoretical study of the atomicforce microscopy imaging process on the NaCl(100) surface, J. Chem. Phys. 108, 359-367 (1998).
85. R. Bennewitz, A.S. Foster, L.N. Kantorovich, M. Bammerlin, Ch. Loppacher, S. Schär, M. Guggisberg, E. Meyer, A.L. Shluger: Atomically resolved edges and kinks of NaCl islands on Cu(111): Experiment and theory, Phys. Rev. B 62, 2074-2084 (2000).
86. U. Landman, W.D. Luetke, M.W. Ribarsky: Structural and dynamical consequences of interactions in interfacial systems, J. Vacuum Sci. Technol. A 7, 2829-2839 (1989).
87. M.R. Sørensen, K.W. Jacobsen, P. Stoltze: Simulations of atomic-scale sliding friction, Phys. Rev. B 53, 2101-2113 (1996).
88. R. Komanduri, N. Chandrasekaran, L.M. Raff: Molecular dynamics simulation of atomic-scale friction, Phys. Rev. B 61, 14007-14019 (2000).
89. A. Buldum, C. Ciraci: Contact, nanoindentation and sliding friction, Phys. Rev. B 57, 2468-2476 (1998).
90. T. H. Fang, C. I. Weng, J. G. Chang: Molecular dynamics simulation of a nanolithography process using atomic force microscopy, Surf. Sci. 501, 138-147 (2002).
91. B. Gotsmann, C. Seidel, B. Anczykowski, H. Fuchs: Conservative and dissipative tip-sample interaction forces probed with dynamic AFM, Phys. Rev. B 60, 11051-11061 (1999).
92. C. Loppacher, R. Bennewitz, O. Pfeiffer, M. Guggisberg, M. Bammerlin, S. Schär, V. Barwich, A. Baratoff, E. Meyer: Experimental aspects of dissipation force microscopy, Phys. Rev. B 62, 13674-13679 (2000).
93. M. Gauthier, M. Tsukada: Theory of noncontact dissipation force microscopy, Phys. Rev. B 60, 11716-11722 (1999).
94. J.P. Aimé, R. Boisgard, L. Nony, G. Couturier: Nonlinear dynamic behavior of an oscillating tip-microlever system and contrast at the atomic scale, Phys. Rev. Lett. 82, 3388-3391 (1999).
95. W. Denk, D.W. Pohl: Local electrical dissipation imaged by scanning force microscopy, Appl. Phys. Lett. 59, 2171-2173 (1991).
96. S. Hirsekorn, U. Rabe, A. Boub, W. Arnold: On the contrast in eddy current microscopy using atomic force microscopes, Surf. Interf. Anal. 27, 474-481 (1999).
97. U. Dürig: Atomic-scale metal adhesion. In: Forces in Scanning Probe Methods, NATO ASI, Ser. E, Vol. 286, ed. by H. J. Güntherodt, D. Anselmetti, E. Meyer (Kluwer, Dordrecht 1995) pp. 191-234.
98. N. Sasaki, M. Tsukada: Effect of microscopic nonconservative process on noncontact atomic force microscopy, Jpn. J. Appl. Phys. 39, L1334-L1337 (2000).
99. B. Gotsmann, H. Fuchs: The measurement of hysteretic forces by dynamic AFM, Appl. Phys. A 72, 55-58 (2001).
100. M. Guggisberg, M. Bammerlin, A. Baratoff, R. Lüthi, C. Loppacher, F.M. Battiston, J. Lü, R. Bennewitz, E. Meyer, H. J. Güntherodt: Dynamic force microscopy across steps on the Si(111)-(7×7) surface, Surf. Sci. 461, 255-265 (2000).
101. R. Bennewitz, S. Schär, V. Barwich, O. Pfeiffer, E.Meyer, F.Krok, B. Such, J. Kolodzej, M. Szymonski: Atomic-resolution images of radiation damage in KBr, Surf. Sci. 474, 197-202 (2001).
102. T. D. Stowe, T.W. Kenny, J. Thomson, D. Rugar: Silicon dopant imaging by dissipation force microscopy, Appl. Phys. Lett. 75, 2785-2787 (1999).
103. B.C. Stipe, H. J. Mamin, T.D. Stowe, T.W. Kenny, D. Rugar: Noncontact friction and force fluctuations between closely spaced bodies, Phys. Rev. Lett. 87, 96801 (2001).
104. B. Gotsmann, H. Fuchs: Dynamic force spectroscopy of conservative and dissipative forces in an Al-Au(111) tip-sample system, Phys. Rev. Lett. 86, 2597-2600 (2001).
105. B. N. J. Persson, A. I. Volokitin: Comment on "Brownian motion of microscopic solids under the action of fluctuating electromagnetic fields", Phys. Rev. Lett. 84, 3504 (2000).
106. K. Yamanaka, A. Noguchi, T. Tsuji, T. Koike, T. Goto: Quantitative material characterization by ultrasonic AFM, Surf. Interf. Anal. 27, 600-606 (1999).
107. T. Drobek, R.W. Stark, W.M. Heckl: Determination of shear stiffness based on thermal noise analysis in atomic force microscopy: Passive overtone microscopy, Phys. Rev. B 64, 045401 (2001).
108. T. Kawagishi, A. Kato, Y. Hoshi, H. Kawakatsu: Mapping of lateral vibration of the tip in atomic force microscopy at the torsional resonance of the cantilever, Ultramicroscopy 91, 37-48 (2002).
109. F. J. Giessibl, M. Herz, J. Mannhart: Friction traced to the single atom, Proc. Natl. Acad. Sci. USA 99, 12006-12010 (2002).
110. H.-J. Hug, A. Baratoff:Measurement of dissipation induced by tip-sample interactions. In: Noncontact Atomic Force Microscopy, ed. by S. Morita, R.Wiesendanger, E. Meyer (Springer, Berlin, Heidelberg 2002) p. 395.