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Volumn 501, Issue 1-2, 2002, Pages 138-147
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Molecular dynamics simulation of nano-lithography process using atomic force microscopy
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Author keywords
Atomic force microscopy; Molecular dynamics
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COMPUTER SIMULATION;
CUTTING TOOLS;
MOLECULAR DYNAMICS;
SURFACE ROUGHNESS;
INTERATOMIC FORCES;
MORSE POTENTIAL FUNCTIONS;
NANOTECHNOLOGY;
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EID: 0037139263
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(01)01938-0 Document Type: Article |
Times cited : (108)
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References (24)
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