Observation of superlubricity by scanning tunneling microscopy

Physical Review Letters

Volumn 78, Issue 8, 1997, Pages 1448-1451

  Hirano, Motohisa ^a   Shinjo, Kazumasa ^b   Kaneko, Reizo ^c   Murata, Yoshitada ^d  

^a NTT CORPORATION   (Japan)

^b ADVANCED TELECOMMUNICATIONS RESEARCH INSTITUTE INTERNATIONAL   (Japan)

^c WAKAYAMA UNIVERSITY   (Japan)

^d UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVES; AUGER ELECTRON SPECTROSCOPY; CALCULATIONS; CRYSTAL ORIENTATION; FORCE MEASUREMENT; FRICTION; LOW ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING SILICON; SENSORS; SURFACES; TUNGSTEN;

ELECTRON BOMBARDMENT; FIELD ELECTRON MICROSCOPY; PIEZOELECTRIC TUBE SCANNER; SUPERLUBRICITY;

SCANNING TUNNELING MICROSCOPY;

EID: 0031079324     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.78.1448     Document Type: Article

References (17)

1. M. Hirano and K. Shinjo: Phys. Rev. B, 41: 11 837 (1990).
2. K. Shinjo and M. Hirano: Surf. Sci., 283: 473 (1993).
3. M. Hirano, K. Shinjo, R. Kaneko, and Y. Murata: Phys. Rev. Lett., 67: 2642 (1991).
4. J. B. Sokoloff: Surf. Sci., 144: 267 (1984).
5. J. B. Sokoloff: Phys. Rev. B, 31: 2270 (1985).
6. G. M. McClelland, in Adhesion and Friction, M. Grunze and H. J. Kreuzer, Springer Series in Surface Science (Springer-Verlag, Berlin, 1990), Vol. 17, p. 1.
7. H. Matsukawa and H. Fukuyama: Phys. Rev. B, 49: 17 286 (1994).
8. M. Hirano, K. Shinjo, R. Kaneko, and Y. Murata, in Proceedings of the American Vacuum Society 41st National Symposium, Colorado, 1994, p. 291 (to be published).
9. J. M. Martin, C. Donnet, Th. Le Mogne, and Th. Epicier: Phys. Rev. B, 48: 10 583 (1993).
10. U. Dürig, J. K. Gimzewski, and D. W. Pohl: Phys. Rev. Lett., 57: 2403 (1986).
11. S. L. Tang, J. Bokor, and R. H. Storz: Appl. Phys. Lett., 52: 189 (1988).
12. K. Kuroda, S. Hosoki, and T. Komoda: Scanning Microsc., 1: 911 (1987).
13. T. Kohno, N. Ozawa, K. Miyamoto, and T. Musha, Appl. Opt., 27: 103 (1988); ZP-01 (Olympus Optical Co., Ltd., Tokyo, Japan).
14. E. W. Müller: Z. Phys., 120: 270 (1943).
15. T. Tabata, T. Aruga, and Y. Murata: Surf. Sci., 179: L63 (1987).
16. Y. Enomoto and D. Tabor: Proc. R. Soc. London A, 373: 405 (1981).
17. D. H. Buckley: ASLE Trans., 11: 89 (1968).