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Ultramicroscopy

Volumn 91, Issue 1-4, 2002, Pages 37-48

Mapping of lateral vibration of the tip in atomic force microscopy at the torsional resonance of the cantilever

(4) Kawagishi, Takayoshi a Kato, Atsushi a Hoshi, Yasuo a Kawakatsu, Hideki a

a INSTITUTE OF INDUSTRIAL SCIENCE (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGING TECHNIQUES; MONOLAYERS; SILICON NITRIDE; TORSIONAL STRESS;

CANTILEVER;

MAPPING;

GRAPHITE; MICA; SILICON; SILICON DIOXIDE; SILICON NITRIDE;

AMPLIFIER; ARTICLE; ATMOSPHERE; ATOMIC FORCE MICROSCOPY; CONTRAST; IMAGING; METHODOLOGY; MOTION; OXIDATION; SAMPLING; SURFACE PROPERTY; TORSION; VIBRATION;

MICA;

EID: 0036320841 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(02)00080-3 Document Type: Article

Times cited : (27)

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