Friction on the atomic scale: An ultrahigh vacuum atomic force microscopy study on ionic crystals

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1280-1284

  Luthi R ^a   Meyer, E ^a   Bammerlin, M ^a   Howald, L ^a   Haefke, H ^a   Lehmann, T ^a   Loppacher, C ^a   Gutherodt H J ^a   Gyalog, T ^a   Thomas, H ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5544269245     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589081     Document Type: Article

References (40)

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