SCOPUS 정보 검색 플랫폼

Volumn 108, Issue 10, 2010, Pages

Impact of stress on the recombination at metal precipitates in silicon

(8) Gundel, Paul a Schubert, Martin C a Heinz, Friedemann D a Kwapil, Wolfram a Warta, Wilhelm a Martinez Criado, Gema b Reiche, Manfred c Weber, Eicke R a

a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE (Germany)

b EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

c MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ENHANCING EFFECT; METAL PRECIPITATES; PIEZORESISTANCE; POSITIVE CORRELATIONS; RECOMBINATION ACTIVITY;

METAL FORMING; METALS;

PRECIPITATES;

EID: 78650287472 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3511749 Document Type: Conference Paper

Times cited : (19)

References (33)

1
- 0031998838
- APAMFC 0947-8396. 10.1007/s003390050649
- A. A. Istratov and E. R. Weber, Appl. Phys. A: Mater. Sci. Process. APAMFC 0947-8396 66, 123 (1998). 10.1007/s003390050649
- (1998) Appl. Phys. A: Mater. Sci. Process. , vol.66 , pp. 123
- Istratov, A.A.¹ Weber, E.R.²

2
- 26944471730
- Engineering metal-impurity nanodefects for low-cost solar cells
- DOI 10.1038/nmat1457, PII N1457
- T. Buonassisi, A. A. Istratov, M. A. Marcus, B. Lai, Z. Cai, S. M. Heald, and E. R. Weber, Nature Mater. NMAACR 1476-1122 4, 676 (2005). 10.1038/nmat1457 (Pubitemid 43090731)
- (2005) Nature Materials , vol.4 , Issue.9 , pp. 676-679
- Buonassisi, T.¹ Istratov, A.A.² Marcus, M.A.³ Lai, B.⁴ Cai, Z.⁵ Heald, S.M.⁶ Weber, E.R.⁷

3
- 41349086199
- Iron point defect reduction in multicrystalline silicon solar cells
- DOI 10.1063/1.2898204
- M. D. Pickett and T. Buonassisi, Appl. Phys. Lett. APPLAB 0003-6951 92, 122103 (2008). 10.1063/1.2898204 (Pubitemid 351451637)
- (2008) Applied Physics Letters , vol.92 , Issue.12 , pp. 122103
- Pickett, M.D.¹ Buonassisi, T.²

4
- 0013160077
- JAPIAU 0021-8979. 10.1063/1.339942
- C. Donolato and M. Kittler, J. Appl. Phys. JAPIAU 0021-8979 63, 1569 (1988). 10.1063/1.339942
- (1988) J. Appl. Phys. , vol.63 , pp. 1569
- Donolato, C.¹ Kittler, M.²

5
- 10744232470
- JAPIAU 0021-8979. 10.1063/1.1636252
- T. Buonassisi, O. F. Vyvenko, A. A. Istratov, E. R. Weber, G. Hahn, D. Sontag, J. P. Rakotoniaina, O. Breitenstein, J. Isenberg, and R. Schindler, J. Appl. Phys. JAPIAU 0021-8979 95, 1556 (2004). 10.1063/1.1636252
- (2004) J. Appl. Phys. , vol.95 , pp. 1556
- Buonassisi, T.¹ Vyvenko, O.F.² Istratov, A.A.³ Weber, E.R.⁴ Hahn, G.⁵ Sontag, D.⁶ Rakotoniaina, J.P.⁷ Breitenstein, O.⁸ Isenberg, J.⁹ Schindler, R.¹⁰

6
- 70349634920
- JAPIAU 0021-8979. 10.1063/1.3224908
- W. Kwapil, M. Kasemann, P. Gundel, M. C. Schubert, W. Warta, P. Bronsveld, and G. Coletti, J. Appl. Phys. JAPIAU 0021-8979 106, 063530 (2009). 10.1063/1.3224908
- (2009) J. Appl. Phys. , vol.106 , pp. 063530
- Kwapil, W.¹ Kasemann, M.² Gundel, P.³ Schubert, M.C.⁴ Warta, W.⁵ Bronsveld, P.⁶ Coletti, G.⁷

7
- 71949108127
- APPLAB 0003-6951. 10.1063/1.3272682
- W. Kwapil, P. Gundel, M. C. Schubert, F. D. Heinz, W. Warta, E. R. Weber, A. Goetzberger, and G. Martinez-Criado, Appl. Phys. Lett. APPLAB 0003-6951 95, 232113 (2009). 10.1063/1.3272682
- (2009) Appl. Phys. Lett. , vol.95 , pp. 232113
- Kwapil, W.¹ Gundel, P.² Schubert, M.C.³ Heinz, F.D.⁴ Warta, W.⁵ Weber, E.R.⁶ Goetzberger, A.⁷ Martinez-Criado, G.⁸

8
- 33748621800
- PHRVAO 0031-899X. 10.1103/PhysRev.87.835
- W. Shockley and W. T. Read, Jr., Phys. Rev. PHRVAO 0031-899X 87, 835 (1952). 10.1103/PhysRev.87.835
- (1952) Phys. Rev. , vol.87 , pp. 835
- Shockley, W.¹ Read Jr., W.T.²

9
- 0027224554
- SSTEET 0268-1242. 10.1088/0268-1242/8/1/007
- C. Donolato, Semicond. Sci. Technol. SSTEET 0268-1242 8, 45 (1993). 10.1088/0268-1242/8/1/007
- (1993) Semicond. Sci. Technol. , vol.8 , pp. 45
- Donolato, C.¹

10
- 36449009428
- APPLAB 0003-6951. 10.1063/1.104474
- M. Kittler, J. Larz, W. Seifert, M. Seibt, and W. Schröter, Appl. Phys. Lett. APPLAB 0003-6951 58, 911 (1991). 10.1063/1.104474
- (1991) Appl. Phys. Lett. , vol.58 , pp. 911
- Kittler, M.¹ Larz, J.² Seifert, W.³ Seibt, M.⁴ Schröter, W.⁵

11
- 33846693940
- PHRVAO 0031-899X. 10.1103/PhysRev.94.42
- C. S. Smith, Phys. Rev. PHRVAO 0031-899X 94, 42 (1954). 10.1103/PhysRev.94.42
- (1954) Phys. Rev. , vol.94 , pp. 42
- Smith, C.S.¹

12
- 0037122117
- JCOMEL 0953-8984. 10.1088/0953-8984/14/48/353
- O. F. Vyvenko, T. Buonassisi, A. A. Istratov, E. R. Weber, M. Kittler, and W. Seifert, J. Phys.: Condens. Matter JCOMEL 0953-8984 14, 13079 (2002). 10.1088/0953-8984/14/48/353
- (2002) J. Phys.: Condens. Matter , vol.14 , pp. 13079
- Vyvenko, O.F.¹ Buonassisi, T.² Istratov, A.A.³ Weber, E.R.⁴ Kittler, M.⁵ Seifert, W.⁶

13
- 23644454835
- Quantifying the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon using synchrotron-based spectrally resolved x-ray beam-induced current
- DOI 10.1063/1.1997274, 044101
- T. Buonassisi, A. A. Istratov, M. D. Pickett, M. A. Marcus, G. Hahn, S. Riepe, J. Isenberg, W. Warta, G. Willeke, T. F. Ciszek, and E. R. Weber, Appl. Phys. Lett. APPLAB 0003-6951 87, 044101 (2005). 10.1063/1.1997274 (Pubitemid 41130172)
- (2005) Applied Physics Letters , vol.87 , Issue.4 , pp. 1-3
- Buonassisi, T.¹ Istratov, A.A.² Pickett, M.D.³ Marcus, M.A.⁴ Hahn, G.⁵ Riepe, S.⁶ Isenberg, J.⁷ Warta, W.⁸ Willeke, G.⁹ Ciszek, T.F.¹⁰ Weber, E.R.¹¹

14
- 78650166264
- 21-25 September, Hamburg, Germany, 10.4229/24thEUPVSEC2009-2AO.3.3
- G. Sarau, M. Becker, S. Christiansen, M. Holla, and W. Seifert, Proceedings of 24th EU-PVSEC, 21-25 September, 2009, Hamburg, Germany, pp. 969-973. 10.4229/24thEUPVSEC2009-2AO.3.3
- (2009) Proceedings of 24th EU-PVSEC , pp. 969-973
- Sarau, G.¹ Becker, M.² Christiansen, S.³ Holla, M.⁴ Seifert, W.⁵

15
- 52349118025
- APPLAB 0003-6951. 10.1063/1.2983649
- J. Chen, B. Chen, S. Takashi, F. Masayuki, and Y. Masayoki, Appl. Phys. Lett. APPLAB 0003-6951 93, 112105 (2008). 10.1063/1.2983649
- (2008) Appl. Phys. Lett. , vol.93 , pp. 112105
- Chen, J.¹ Chen, B.² Takashi, S.³ Masayuki, F.⁴ Masayoki, Y.⁵

16
- 33747188574
- Quantitative pressure and strain field analysis of helium precipitates in silicon
- DOI 10.1007/s10853-006-0153-1
- N. Hueging, M. Luysber, H. Trinkaus, K. Tillmann, and K. Urban, J. Mater. Sci. JMTSAS 0022-2461 41, 4454 (2006). 10.1007/s10853-006-0153-1 (Pubitemid 44226126)
- (2006) Journal of Materials Science , vol.41 , Issue.14 , pp. 4454-4465
- Hueging, N.¹ Luysberg, M.² Trinkaus, H.³ Tillmann, K.⁴ Urban, K.⁵

17
- 71149112338
- ZZZZZZ 1862-6254. 10.1002/pssr.200903221
- P. Gundel, M. C. Schubert, W. Kwapil, J. Schön, M. Reiche, H. Savin, M. Yli-Koski, J. A. Sans, G. Martinez-Criado, W. Seifert, W. Warta, and E. R. Weber, Phys. Status Solidi (RRL) ZZZZZZ 1862-6254 3, 230 (2009). 10.1002/pssr.200903221
- (2009) Phys. Status Solidi (RRL) , vol.3 , pp. 230
- Gundel, P.¹ Schubert, M.C.² Kwapil, W.³ Schön, J.⁴ Reiche, M.⁵ Savin, H.⁶ Yli-Koski, M.⁷ Sans, J.A.⁸ Martinez-Criado, G.⁹ Seifert, W.¹⁰ Warta, W.¹¹ Weber, E.R.¹²

18
- 76949095562
- PSSABA 0031-8965. 10.1002/pssa.200925368
- P. Gundel, M. C. Schubert, and W. Warta, Phys. Status Solidi A PSSABA 0031-8965 207, 436 (2010). 10.1002/pssa.200925368
- (2010) Phys. Status Solidi A , vol.207 , pp. 436
- Gundel, P.¹ Schubert, M.C.² Warta, W.³

19
- 77954780816
- ZZZZZZ 1862-6254. 10.1002/pssr.201004170
- P. Gundel, M. C. Schubert, F. D. Heinz, J. Benick, I. Zizak, and W. Warta, Phys. Status Solidi (RRL) ZZZZZZ 1862-6254 4, 160 (2010). 10.1002/pssr.201004170
- (2010) Phys. Status Solidi (RRL) , vol.4 , pp. 160
- Gundel, P.¹ Schubert, M.C.² Heinz, F.D.³ Benick, J.⁴ Zizak, I.⁵ Warta, W.⁶

20
- 73949132080
- ZZZZZZ 1862-6254. 10.1002/pssr.200903263
- P. Gundel, G. Martinez-Criado, M. C. Schubert, J. Angel Sans, W. Kwapil, W. Warta, and E. R. Weber, Phys. Status Solidi (RRL) ZZZZZZ 1862-6254 3, 275 (2009). 10.1002/pssr.200903263
- (2009) Phys. Status Solidi (RRL) , vol.3 , pp. 275
- Gundel, P.¹ Martinez-Criado, G.² Schubert, M.C.³ Angel Sans, J.⁴ Kwapil, W.⁵ Warta, W.⁶ Weber, E.R.⁷

21
- 64749095733
- MSFOEP 0255-5476. 10.4028/www.scientific.net/MSF.590.57
- M. Reiche, Mater. Sci. Forum MSFOEP 0255-5476 590, 57 (2008). 10.4028/www.scientific.net/MSF.590.57
- (2008) Mater. Sci. Forum , vol.590 , pp. 57
- Reiche, M.¹

22
- 0000960508
- APPLAB 0003-6951. 10.1063/1.126778
- P. S. Plekhanov and T. Y. Tan, Appl. Phys. Lett. APPLAB 0003-6951 76, 3777 (2000). 10.1063/1.126778
- (2000) Appl. Phys. Lett. , vol.76 , pp. 3777
- Plekhanov, P.S.¹ Tan, T.Y.²

23
- 0000499171
- Direct correlation of transition metal impurities and minority carrier recombination in multicrystalline silicon
- DOI 10.1063/1.121673, PII S0003695198012261
- S. A. McHugo, A. C. Thompson, I. Ṕrichaud, and S. Martinuzzi, Appl. Phys. Lett. APPLAB 0003-6951 72, 3482 (1998). 10.1063/1.121673 (Pubitemid 128673691)
- (1998) Applied Physics Letters , vol.72 , Issue.26 , pp. 3482-3484
- McHugo, S.A.¹ Thompson, A.C.² Perichaud, I.³ Martinuzzi, S.⁴

24
- 0030081591
- SSTEET 0268-1242. 10.1088/0268-1242/11/2/001
- I. De Wolf, Semicond. Sci. Technol. SSTEET 0268-1242 11, 139 (1996). 10.1088/0268-1242/11/2/001
- (1996) Semicond. Sci. Technol. , vol.11 , pp. 139
- De Wolf, I.¹

25
- 45149120525
- APPLAB 0003-6951. 10.1063/1.2942392
- L. O'Reilly, K. Horan, P. J. McNally, N. S. Bennett, N. E. B. Cowern, A. Lankinen, B. J. Sealy, R. M. Gwilliam, T. C. Q. Noakes, and P. Bailey, Appl. Phys. Lett. APPLAB 0003-6951 92, 233506 (2008). 10.1063/1.2942392
- (2008) Appl. Phys. Lett. , vol.92 , pp. 233506
- O'Reilly, L.¹ Horan, K.² McNally, P.J.³ Bennett, N.S.⁴ Cowern, N.E.B.⁵ Lankinen, A.⁶ Sealy, B.J.⁷ Gwilliam, R.M.⁸ Noakes, T.C.Q.⁹ Bailey, P.¹⁰

26
- 0000305655
- PLRBAQ 0556-2805. 10.1103/PhysRevB.5.1440
- F. Cerdeira and M. Cardona, Phys. Rev. B PLRBAQ 0556-2805 5, 1440 (1972). 10.1103/PhysRevB.5.1440
- (1972) Phys. Rev. B , vol.5 , pp. 1440
- Cerdeira, F.¹ Cardona, M.²

27
- 0039014466
- SPSEAX 0038-5700.
- A. A. Volfson and V. K. Subashiev, Sov. Phys. Semicond. SPSEAX 0038-5700 1, 327 (1967).
- (1967) Sov. Phys. Semicond. , vol.1 , pp. 327
- Volfson, A.A.¹ Subashiev, V.K.²

28
- 17444440768
- ASUSEE 0169-4332. 10.1016/S0169-4332(98)00052-X
- M. Yonemura, K. Sueoka, and K. Kamei, Appl. Surf. Sci. ASUSEE 0169-4332 130-132, 208 (1998). 10.1016/S0169-4332(98)00052-X
- (1998) Appl. Surf. Sci. , vol.130-132 , pp. 208
- Yonemura, M.¹ Sueoka, K.² Kamei, K.³

29
- 19944433396
- Strained Si, SiGe, and Ge channels for high-mobility metal-oxide- semiconductor field-effect transistors
- DOI 10.1063/1.1819976, 011101
- M. L. Lee, E. A. Fitzgerald, M. T. Bulsara, M. T. Currie, and A. Lochtefeld, J. Appl. Phys. JAPIAU 0021-8979 97, 011101 (2005). 10.1063/1.1819976 (Pubitemid 40183093)
- (2005) Journal of Applied Physics , vol.97 , Issue.1 , pp. 0111011-01110127
- Lee, M.L.¹ Fitzgerald, E.A.² Bulsara, M.T.³ Currie, M.T.⁴ Lochtefeld, A.⁵

30
- 43949124178
- Effect of silicon interstitials on Cu precipitation in n -type Czochralski silicon
- DOI 10.1063/1.2908215
- W. Wang, D. Yang, X. Ma, and D. Que, J. Appl. Phys. JAPIAU 0021-8979 103, 093534 (2008). 10.1063/1.2908215 (Pubitemid 351706941)
- (2008) Journal of Applied Physics , vol.103 , Issue.9 , pp. 093534
- Wang, W.¹ Yang, D.² Ma, X.³ Que, D.⁴

31
- 77955882461
- JAPIAU 0021-8979. 10.1063/1.3462433
- P. Gundel, F. D. Heinz, M. C. Schubert, J. A. Giesecke, and W. Warta, J. Appl. Phys. JAPIAU 0021-8979 108, 033705 (2010). 10.1063/1.3462433
- (2010) J. Appl. Phys. , vol.108 , pp. 033705
- Gundel, P.¹ Heinz, F.D.² Schubert, M.C.³ Giesecke, J.A.⁴ Warta, W.⁵

32
- 34047174569
- Grain orientation, texture, and internal stress optically evaluated by micro-Raman spectroscopy
- DOI 10.1063/1.2434961
- M. Becker, H. Scheel, S. Christiansen, and H. P. Strunk, J. Appl. Phys. JAPIAU 0021-8979 101, 063531 (2007). 10.1063/1.2434961 (Pubitemid 46516993)
- (2007) Journal of Applied Physics , vol.101 , Issue.6 , pp. 063531
- Becker, M.¹ Scheel, H.² Christiansen, S.³ Strunk, H.P.⁴

33
- 0004192386
- (Springer, Berlin).
- K. Graff, Metal Impurities in Silicon-Device Fabrication (Springer, Berlin, 2000).
- (2000) Metal Impurities in Silicon-Device Fabrication
- Graff, K.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.