Direct correlation of transition metal impurities and minority carrier recombination in multicrystalline silicon

Applied Physics Letters

Volumn 72, Issue 26, 1998, Pages 3482-3484

  McHugo, Scott A ^a   Thompson, A C ^a   Perichaud I ^b   Martinuzzi, S ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b AIX MARSEILLE UNIVERSITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000499171     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121673     Document Type: Article

References (15)

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