SCOPUS 정보 검색 플랫폼

Volumn 14, Issue 48, 2002, Pages 13079-13086

Application of synchrotron-radiation-based x-ray microprobe techniques for the analysis of recombination activity of metals precipitated at Si/SiGe misfit dislocations

(6) Vyvenko, O F a,c Buonassisi, T a Istratov, A A a Weber, E R a Kittler, M b Seifert, W b

a UNIVERSITY OF CALIFORNIA (United States)

b IHP (Germany)

c ST PETERSBURG STATE UNIVERSITY (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; DISLOCATIONS (CRYSTALS); HYDROGEN; IMPURITIES; IRON; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SYNCHROTRON RADIATION;

RECOMBINATION ACTIVITY; SILICON GERMANIUM; SPACE DISTRIBUTION; X RAY BEAM INDUCED CURRENT TECHNIQUE; X RAY FLUORESCENCE TECHNIQUE; X RAY MICROPROBE TECHNIQUES;

X RAY ANALYSIS;

EID: 0037122117 PISSN: 09538984 EISSN: None Source Type: Journal
DOI: 10.1088/0953-8984/14/48/353 Document Type: Article

Times cited : (22)

References (14)

1
- 0034187515
- Istratov A A, Hieslmair H and Weber E R 2000 Appl. Phys. A 70 489-534
- (2000) Appl. Phys. A , vol.70 , pp. 489-534
- Istratov, A.A.¹ Hieslmair, H.² Weber, E.R.³

2
- 0031998838
- Istratov A A and Weber E R 1998 Appl. Phys. A 66 123-36
- (1998) Appl. Phys. A , vol.66 , pp. 123-136
- Istratov, A.A.¹ Weber, E.R.²

3
- 17544366255
- Riedel F, Kronewitz J, Gnauert U, Seibt M and Schröter W 1996 Solid State Phenom. 47-8 359-64
- (1996) Solid State Phenom. , vol.47-48 , pp. 359-364
- Riedel, F.¹ Kronewitz, J.² Gnauert, U.³ Seibt, M.⁴ Schröter, W.⁵

4
- 0034664545
- Riedel F and Schröter W 2000 Phys. Rev. B 62 7150-6
- (2000) Phys. Rev. B , vol.62 , pp. 7150-7156
- Riedel, F.¹ Schröter, W.²

5
- 0032203340
- Istratov A A, Hedemann H, Seibt M, Vyvenko O F, Schröter W, Heiser T, Flink C, Hieslmair H and Weber E R 1998 J. Electrochem. Soc. 145 3889-98
- (1998) J. Electrochem. Soc. , vol.145 , pp. 3889-3898
- Istratov, A.A.¹ Hedemann, H.² Seibt, M.³ Vyvenko, O.F.⁴ Schröter, W.⁵ Heiser, T.⁶ Flink, C.⁷ Hieslmair, H.⁸ Weber, E.R.⁹

6
- 0000960508
- Plekhanov P S and Tan T Y 2000 Appl. Phys. Lett. 76 3777-9
- (2000) Appl. Phys. Lett. , vol.76 , pp. 3777-3779
- Plekhanov, P.S.¹ Tan, T.Y.²

7
- 0033893288
- McHugo S A, Thompson A C, Flink C, Weber E R, Lamble G, Gunion B, MacDowell A, Celestre R, Padmore H A and Hussain Z 2000 J. Cryst. Growth 210 395-400
- (2000) J. Cryst. Growth , vol.210 , pp. 395-400
- McHugo, S.A.¹ Thompson, A.C.² Flink, C.³ Weber, E.R.⁴ Lamble, G.⁵ Gunion, B.⁶ MacDowell, A.⁷ Celestre, R.⁸ Padmore, H.A.⁹ Hussain, Z.¹⁰

8
- 0037087359
- Vyvenko O F, Buonassisi T, Istratov A A, Hieslmair H, Thompson A C, Schindler R and Weber E R 2002 J. Appl. Phys. 91 3614-17
- (2002) J. Appl. Phys. , vol.91 , pp. 3614-3617
- Vyvenko, O.F.¹ Buonassisi, T.² Istratov, A.A.³ Hieslmair, H.⁴ Thompson, A.C.⁵ Schindler, R.⁶ Weber, E.R.⁷

9
- 84983287232
- Kittler M, Seifert W and Higgs V 1993 Phys. Status Solidi a 137 327-35
- (1993) Phys. Status Solidi a , vol.137 , pp. 327-335
- Kittler, M.¹ Seifert, W.² Higgs, V.³

10
- 36448999240
- Kittler M. Ulhaq-Bouillet C and Higgs V 1995 J. Appl. Phys. 78 4573-83
- (1995) J. Appl. Phys. , vol.78 , pp. 4573-4583
- Kittler, M.¹ Ulhaq-Bouillet, C.² Higgs, V.³

11
- 0026626780
- Donolato C 1992 Semicond. Sci. Technol. 7 37-43
- (1992) Semicond. Sci. Technol. , vol.7 , pp. 37-43
- Donolato, C.¹

12
- 0027224554
- Donolato C 1993 Semicond. Sci. Technol. 8 45-9
- (1993) Semicond. Sci. Technol. , vol.8 , pp. 45-49
- Donolato, C.¹

13
- 36449009428
- Kittler M, Larz J, Seifert W, Seibt M and Schröter W 1991 Appl. Phys. Lett. 58 911-13
- (1991) Appl. Phys. Lett. , vol.58 , pp. 911-913
- Kittler, M.¹ Larz, J.² Seifert, W.³ Seibt, M.⁴ Schröter, W.⁵

14
- 0000837722
- Ronay M and Schad R G 1990 Phys. Rev. Lett. 64 2042-5
- (1990) Phys. Rev. Lett. , vol.64 , pp. 2042-2045
- Ronay, M.¹ Schad, R.G.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.