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Volumn 87, Issue 4, 2005, Pages
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Quantifying the effect of metal-rich precipitates on minority carrier diffusion length in multicrystalline silicon using synchrotron-based spectrally resolved x-ray beam-induced current
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFUSION LENGTH;
MINORITY CARRIERS;
NANOPRECIPITATES;
NICKEL SILICIDE;
ABSORPTION SPECTROSCOPY;
DIFFUSION;
FLUORESCENCE;
LIGHT ABSORPTION;
NANOSTRUCTURED MATERIALS;
NICKEL COMPOUNDS;
PHOTONS;
SEMICONDUCTOR DEVICES;
SILICON;
SYNCHROTRON RADIATION;
X RAYS;
PRECIPITATION (CHEMICAL);
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EID: 23644454835
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1997274 Document Type: Article |
Times cited : (27)
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References (17)
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