Shearography technology and applications: A review

Measurement Science and Technology

Volumn 21, Issue 10, 2010, Pages

  Francis, D ^a,b   Tatam, R P ^b   Groves, R M ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b CRANFIELD UNIVERSITY   (United Kingdom)

Author keywords

Non destructive testing; Shearography; Speckle interferometry; Strain measurement

Indexed keywords

IMAGE PROCESSING; NONDESTRUCTIVE EXAMINATION; OPTICAL DATA PROCESSING; SPECKLE; STRAIN MEASUREMENT;

ENVIRONMENTAL DISTURBANCES; IMAGE PROCESSING ALGORITHM; INTERFEROMETRIC TECHNIQUES; NON DESTRUCTIVE TESTING; OPTICAL CONFIGURATIONS; SHEAROGRAPHY; SPECKLE INTERFEROMETRY; SURFACE STRAIN MEASUREMENTS;

INTERFEROMETRY;

EID: 78149296770     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/21/10/102001     Document Type: Review

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