Strain Distributions made Visible with Image-shearing Speckle Pattern Interferometry

Optics and Lasers in Engineering

Volumn 26, Issue 4-5 SPEC. ISS., 1997, Pages 407-420

  Aebischer, Hubert A ^a   Waldner, Stephan ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE SHEARING SPECKLE PATTERN INTERFEROMETRY; OUT OF PLANE DISPLACEMENT; SHEAROGRAPHY; STRAIN CONCENTRATION; STRAIN DISTRIBUTION;

DEFORMATION; FINITE ELEMENT METHOD; IMAGING SYSTEMS; LIGHT SOURCES; NUMERICAL ANALYSIS; OPTICAL SYSTEMS; PHASE SHIFT; SPECKLE; STRAIN MEASUREMENT;

INTERFEROMETRY;

EID: 0031103610     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/0143-8166(95)00140-9     Document Type: Article

References (12)

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