Slope measurement by two-wavelength electronic shearography

Optics and Lasers in Engineering

Volumn 27, Issue 3, 1997, Pages 321-333

  Huang, J R ^a   Ford, H D ^a   Tatam, R P ^a  

^a CRANFIELD UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROOPTICAL DEVICES; LIGHT REFRACTION; OPTICAL CORRELATION; SEMICONDUCTOR LASERS;

ELECTRONIC SHEAROGRAPHY; FRINGE ANALYSIS; PHASE STEPPING TECHNIQUE; SLOPE MEASUREMENT;

SURFACE MEASUREMENT;

EID: 0031166114     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/0143-8166(95)00124-7     Document Type: Article

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