Compact shearography system for the measurement of 3D deformation

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3745, Issue , 1999, Pages 141-148

  Waldner, Stephan ^a   Brem, Stefan ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

SHEAROGRAPHY; SPECKLE INTERFEROMETRY;

NONDESTRUCTIVE EXAMINATION; OPTICAL DESIGN; OPTICAL FILTERS; SPECKLE; STRAIN MEASUREMENT;

INTERFEROMETRY;

EID: 0032646787     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (6)