A new method for phase extraction from a single fringe pattern

Optics Communications

Volumn 239, Issue 4-6, 2004, Pages 251-258

  Tay, C J ^a   Quan, C ^a   Yang, F J ^a   He, X Y ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b SOUTHEAST UNIVERSITY   (China)

Author keywords

Fringe analysis; Phase extraction; Speckle interferometry

Indexed keywords

ALGORITHMS; DEMODULATION; IMAGE ANALYSIS; INTERFEROMETRY; INTERPOLATION; LINEAR SYSTEMS; PHASE SHIFT; SPECKLE;

FRINGE ANALYSIS; PHASE EXTRACTION; SPECKLE INTERFEROMETRY;

OPTICAL SYSTEMS;

EID: 4344687513     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2004.05.046     Document Type: Article

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